Online-Seminar: Optical Tools for the Characterisation of Plasma and their Dynamics
Non-invasive, in situ optical diagnostics can provide detailed information on spatio-temporal structures and chemical makeup, electron temperature and density of a wide range of plasma types. The sometimes fast evolving behaviour, complex chemical signatures, size of feature of interest or optical emission intensity range/dynamic provide interesting challenges for imaging and/or spectral acquisition setups. Thomas Woodward, application specialist at Andor Technology, will discuss how ultra-fast nano second time gated CCDs/sCMOS, and ultra-sensitive EMCCDs can address some of these challenges.
If you are unfamiliar with ICCDs, in advance of this online-seminar it may be of interest to you to watch this recently recorded online-seminar on the functionality of ICCD cameras.
Speaker: Dr. Thomas Woodward, High Energy Detection Product Specialist at Andor Technology
Date: Tuesday, July 21st - h. 16:00 - 17:00 CEST
Note: A link to the recording of this presentation will be provided to all registrants, even if they are unable to attend at the time of broadcast.
Date: Tuesday, July 21st - h. 16:00 - 17:00 CEST
