Materials science

Characterisation of physical properties

Hall effect

Systems to measure physical properties

Very-low resistance measurements

Furnace for crystal fabrication

Furnace for crystal fabrication

Interferometers

Interferometer systems

Microscopy

3D Confocal Raman microscopes

Atomic force microscopes (AFM)

Correlative Microscopy – Raman/AFM/SNOM/SEM

Scanning nearfield optical microscopes (SNOM)

Particle size analyzers

Particle size analyzers

Photo lithography systems

Photo lithography systems

Preparation and characterisation of thin films

Flexus thin film stress measurement systems

Nanoindenters - Nanohardness tester

QCM-D Quartz Crystal Microbalance

Spectroscopic ellipsometers

Spin coater

Profiler

Optical surface profilers