Correlative Microscopy – Raman/AFM/SNOM/SEM
- Magnetism
- Materials science
- Spectroscopy
- Imaging
- 3D Confocal Raman microscopes
- CCD, EMCCD and sCMOS cameras for imaging
- Camera modules for the short, mid and long wave infrared
- Cameras and detectors for time-resolved imaging and spectroscopy
- Cameras for EUV, X-ray and high-energy particle detection
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- High-end thermography cameras
- High-speed infrared cameras
- Highest speed cameras
- Hyperspectral cameras
- Hyperspectral remote sensing systems
- Hyperspectral systems
- Imaging spectrographs
- Line-scan cameras for NIR and SWIR
- Longwave thermography cameras
- Mid and longwave infrared cameras
- Near infrared and shortwave infrared cameras
- Scanning nearfield optical microscopes (SNOM)
- Thermographic NDT and NDE
- Visible range infrared cameras
- X-ray analytical instrumentation
- X-ray sources
- X-ray windows
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
The AFSEM system enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market ...
The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument ...
For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with scanning near-field optical microscopy (SNOM) for optical imaging with ...
The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging ...