Atomic force microscopes (AFM)

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a ... more 

Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.

Atomic force microscopes (AFM) - Nanoscale surface characterization system
Nanoscale surface characterization system

The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy ...


Atomic force microscopes (AFM) - Chemical and nanoscale imaging system
Chemical and nanoscale imaging system

The well-established Raman-atomic force microscope (AFM) combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument ...


Atomic force microscopes (AFM) - Raman, AFM and SNOM all-in-one system
Raman, AFM and SNOM all-in-one system

The unprecedented all-in-one alpha300 RAS combines Raman, AFM, and SNOM imaging in a single instrument for the utmost flexibility and sophisticated sample characterization. By combining the imaging ...

Contact

Quantum Design GmbH

ul. Sztygarska 12/3
41-500 Chorzow
Poland

Phone:+48 32 2482048
Mobile:+48 515 166893
Fax:+48 32 7021160
E-mail: 
poland@qd-europe.com