W3+ Fair Convention

At W3+, Ms. Jennifer Kraus and Mr. Uwe Schmidt will present optical components and measurement technology—from polarizers and metalenses to complete systems for photometry and scientific 
applications.

They will also showcase EMCCD and ICCD cameras for measurements at extremely low light intensities or time-resolved measurements, as well as high-speed cameras for fast dynamic processes. 
The portfolio is rounded out by systems specifically designed for the UV, VIS, NIR/IR, and X-ray spectral ranges, as well as hyperspectral imaging solutions for spectrally resolved 
imaging and materials analysis.

We look forward to seeing you in Hall 2, Booth F13a!