Materials science

Characterisation of physical properties

Hall effect

Systems to measure physical properties

Very-low resistance measurements

Furnace for crystal fabrication

Furnace for crystal fabrication

Microscopy

Atomic force microscopes (AFM)

Correlative Microscopy – Raman/AFM/SNOM/SEM

Particle size analyzers

Particle size analyzers

Photo lithography systems

Photo lithography systems

Preparation and characterisation of thin films

Flexus thin film stress measurement systems

Spectroscopic ellipsometers

Spin coater