Atomic force microscopes for research
- Magnetism
- Materials science
- Atomic force microscopes for research
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Particle size analyzer
- Photo lithography systems
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a ... more
Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.
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