Atomic force microscopes (AFM)
Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can ...
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Atomic Force Microscopy (AFM) traces the topography of samples with extremely high- up to atomic- resolution by recording the interaction forces between the surface and a sharp tip mounted on a cantilever. AFM provides spatial information parallel and perpendicular to the surface. In addition to topographic high-resolution information, local material properties such as adhesion and stiffness can be investigated by analyzing tip-sample interaction forces. We offer AFMs suitable for research in materials science, polymers, electrochemistry, and other applications in nano-science and engineering.
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Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the ...
