Spectroscopic ellipsometers

Ellipsometry, single wavelength ellipsometry or spectroscopic ellipsometry, is a method to determine layer thickness and optical constants of thin films or substrates. An ellipsometer, either a ... more 

Ellipsometry, single wavelength ellipsometry or spectroscopic ellipsometry, is a method to determine layer thickness and optical constants of thin films or substrates. An ellipsometer, either a single wavelength or a spectroscopic ellipsometer, measures the polarization change at reflection (or transmission in case of anisotropic sample).

We offer a wide range of spectroscopic ellipsometers, optimized for your particular application. The flexible ellipsometer VASE and VUV-VASE, based on a scanning monochromator is ideal for all kinds of R&D applications, covering the widest spectral range in the market from 140 to 4000 nm, or in combination with IR-VASE up to 30 µm. Alternatively, our fast CCD based, rotating compensator spectroscopic ellipsometers M-2000 and RC2 are available for ex-situ as well as in-situ applications.

Spectroscopic ellipsometers - Short introduction: Ellipsometry
Short introduction: Ellipsometry

What is Ellipsometry? This brief introduction to ellipsometry is targeted to the novice and provides a fundamental description of ellipsometry measurements and typical data analysis procedures. The ...


Spectroscopic ellipsometers - Fast Mapping theta-SE
Fast Mapping theta-SE

The theta-SE is a push-button spectroscopic ellipsometer for characterizing thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price.


Spectroscopic ellipsometers - In-situ spectroscopic ellipsometer iSE
In-situ spectroscopic ellipsometer iSE

The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of ...


Spectroscopic ellipsometers - Fast spectroscopic ellipsometer M-2000
Fast spectroscopic ellipsometer M-2000

The M-2000 ellipsometer combines highly accurate 'rotating compensator' method with fast CCD technology. This allows high speed measurements: min. 390 wavelengths in < 1 second. It is available as ...


Spectroscopic ellipsometers - Dual rotating compensator ellipsometer RC2
Dual rotating compensator ellipsometer RC2

The RC2 is the first spectroscopic ellipsometer with two rotating compensators. It combines the best features of previous instruments with innovative new technology: dual rotating compensator, ...


Spectroscopic ellipsometers - Economic high precision table top ellipsometer Alpha-SE
Economic high precision table top ellipsometer Alpha-SE

Spectroscopic ellipsometer Alpha-SE is a fast, low-cost system for measuring film thickness and optical constants. Everything is contained in an amazingly small package. It is the ideal table top ...


Spectroscopic ellipsometers - Widest spectral range ellipsometer VASE
Widest spectral range ellipsometer VASE

The VASE is our most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers and more.


Spectroscopic ellipsometers - Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE
Spectroscopic ellipsometer for Vacuum Ultra Violet: VUV-VASE

The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) ...


Spectroscopic ellipsometers - FTIR ellipsometer IR-VASE
FTIR ellipsometer IR-VASE

The IR-VASE is the first and only spectroscopic ellipsometer to cover the spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). The IR-VASE can determine both n and k for materials over the ...


Spectroscopic ellipsometers - Ellipsometer for texture Si solar cells T-Solar
Ellipsometer for texture Si solar cells T-Solar

T-Solar, a special intensity optimized M-2000, addresses the measurement requirements on textures Si wafer surfaces.

Contact

Quantum Design

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030041 Bucharest
Romania

Phone:+40 755039900
Fax:+40 317107156
E-mail:romania@qd-europe.com
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