Unser Partner
CCD- und sCMOS-Kameras für direkte Detektion
Marana-X, iKon SO und Newton SO von Oxford Instruments AndorNeben dem Standardeinsatz als bildgebende Systeme eignen sich sCMOS- und CCD-Sensoren auch zur direkten Detektion von Licht im VUV- und EUV-Bereich und weicher Röntgenstrahlung. Zu diesem Zweck bieten wir Back Illuminated CCD- und sCMOS-Sensoren ohne Beschichtungen und Mikrolinsen-Arrays an. Thermoelektrische Tieftemperaturkühlung und ausgezeichnete Linearität und Homogenität ermöglichen auch die Detektion schwacher Signale mit langen Belichtungszeiten.
- Back-Illuminated-CCD- und sCMOS-Sensoren ohne Entspiegelungen
- Pixelgrößen 6,5 µm, 13 µm, 13,5 µm, 15 µm und 26 µm
- Thermoelektrische Kühlung bis -100 °C für niedrigen Dunkelstrom
- Hochwertige 16- und 18-Bit-A/D-Wandler für niedriges Ausleserauschen
- Flansche kompatibel mit beliebigen Vakuumanschlüssen
Weitere Informationen
Wir bieten vakuumkompatible CCD-Detektoren mit unterschiedlichen Sensorformaten. Die Detektion von Licht im VUV- und EUV-Bereich sowie weicher Röntgenstrahlung erfolgt durch direkte Absorption von Photonen in der Verarmungsschicht eines Pixel. Abhängig von der Energie der Photonen entsteht eine bestimmte Anzahl von Elektronenlochpaaren. Hervorragende Linearität und Homogenität gewährleistet eine hohe Qualität der Messdaten. CF- und sonstige Vakuumflansche können auf Anfrage angeboten werden. Andor-Röntgenkameras kommen in zahlreichen Forschungslaboratorien für Hochenergiephysik weltweit zum Einsatz.
Spezifikationen
pdf
Marana-X.pdf
3.56 MB
Marana-X
pdf
iKon-XL_SO.pdf
2.92 MB
iKon-XL SO 231 (4096 x 4108 x 15 µm)
pdf
iKon-M-L_SO.pdf
2.82 MB
iKon-L SO 936 (2048 x 2048 x 13,5 µm)
pdf
Newton_SO.pdf
2.46 MB
Newton SO 940 (2048 x 512 x 13,5 µm)
Anwendungen
Erzeugung von Harmonischen höherer Ordnung
Weiche Röntgenstrahlung
Spektroskopie im VUV- und EUV-Bereich
Synchrotron-Strahlung
Röntgentomographie
Downloads
Videos
Webinar Scientific Cameras Part 1
Webinar Scientific Cameras Part 2
The Future of Fast, High DNR Soft X Ray & EUV Detection
Remote Camera Server Online Seminar
Referenzkunden
| Title | Author(s) | Institute | Year | Detector |
|---|---|---|---|---|
| Spectroscopy | ||||
| Ultra-broadband spectrometry in the extreme ultraviolet (EUV) | L. Bahrenberg, S. Schröder, S. Brose | Chair for Technology of Optical Systems (TOS), RWTH Aachen University, Germany | 2020 | Newton SO DO940P-BN |
| A new compact soft X-ray spectrometer for RIXS studies at PETRA III | Z. Yin1,2, S. Techert1,2,3 | 1 FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany | 2017 | iKon-L SO DO936N-OZ-BN |
| High-harmonic radiation for seeding the swiss free electron lase | J. Rauschenberger1, C. Hauri2 | 1H+P SPECTROSCOPY, Dr. Hoerlein + Partner GbR, Mannheim, Germany, 2Paul Scherrer Institut, Villigen, Switzerland | 2016 | Newton SO DO940P-BN |
| Investigation of spin dynamics in Ni-Pd alloys using extreme ultraviolet radiation | S. Gang, R. Adam, M. Plötzing, C. M. Schneider | Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany | 2016 | Newton SO DO920P-BEN |
| Compact soft x-ray spectrometer for laser-matter studies | R. Irsig | Institute of Physics, University of Rostock, Germany | 2012 |
|
| Warm dense matter analysis | P. Neumayer, D. Hochhaus et al. | GSI, Darmstadt, Germany | 2012 | iKon-M SO DO934P-BN |
| Element-selective ultrafast magnetization dynamics | D. Rudolf1, Chan La-O-Vorakiat2, E. Turgut2, P. Grychtol1,4, R. Adam1, S. Mathias4, J. M. Shaw3, H. T. Nembach3, T. J. Silva 3, M. Aeschlimann4, C. M. Schneider1, M. M. Murnane2, H. C. Kapteyn2 | 1Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany 2Department of Physics and JILA, University of Colorado, Boulder, USA 3Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA 4University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany | 2012 | iKon-L SO DO936N-MW-BN |
| Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases | T. Popmintchev1, M.-C. Chen1, D. Popmintchev1, S. Ališauskas2, G. Andriukaitis2, T. Balčiūnas2, A. Pugžlys2, A. Baltuška2, M. Murnane1, H. Kapteyn1 | 1 JILA, University of Colorado, Boulder, USA 2 Photonics Institute, Vienna University of Technology, Austria | 2011 | Newton SO DO920N-BN |
| Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates | M. Ibek, T. Leitner, P. Wernet, A. Firsov, A. Erko | Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany | 2011 | iKon-L SO DO936N-MW-BN |
| Sample analysis with a grazing incidence XUV reflectometer | S. Brose, M. Banyay, L. Juschkin, S. Danylyuk | Chair for the Technology of Optical Systems, RWTH Aachen, Germany | 2011 | DX440-BN2 |
| Single event spectroscopy on laser generated x-ray beams | C. Kern, M. Schnell, C. Spielmann | Institute of Optics and Quantum Electronics, University of Jena, Germany | 2010 | iKon-L SO DO936N-MW-BN |
| Spectral and spatial characterization of harmonics in the XUV region | S. Eyring, C. Kern, J. Lohbreier, R. Spitzenpfeil, C. Spielmann | Institute of Optics and Quantum Electronics, University of Jena, Germany | 2009 | DO420-BN1 |
| A calibrated compact soft X-Ray spectrometer | H. Stiel, H. Legall | Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany | 2009 | iDus SO DO420A-BN3 |
| Time resolved X-Ray diffraction | I. Uschmann | Institute of Optics and Quantumelectronics, University of Jena, Germany | 2007 | DX420-BR-DD2 |
| Laserartige XUV-Strahlung: Charakterisierung und Handhabung von Gasharmonischen | A. Klein, D. Hemmers, G. Pretzler | Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany | 2006 | DO420-BN1 |
| Characterization of light sources | ||||
| High-harmonic radiation for seeding the swiss free electron lase | J. Rauschenberger1, C. Hauri2 | 1H+P SPECTROSCOPY, Dr. Hoerlein + Partner GbR, Mannheim, Germany, 2Paul Scherrer Institut, Villigen, Switzerland | 2016 | Newton DO940P-BN |
| Spatial characterization of a discharge based radiation | K. Bergmann, J. Vieker | Fraunhofer Institute for Laser Technology, Aachen, Germany | 2013 | iKon-M SO DO934P-BN |
| Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases | T. Popmintchev1, M.-C. Chen1, D. Popmintchev1, S. Ališauskas2, G. Andriukaitis2, T. Balčiūnas2, A. Pugžlys2, A. Baltuška2, M. Murnane1, H. Kapteyn1 | 1 JILA, University of Colorado, Boulder, USA 2 Photonics Institute, Vienna University of Technology, Austria | 2011 | Newton SO DO920N-BN |
| Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates | M. Ibek, T. Leitner, P. Wernet, A. Firsov, A. Erko | Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany | 2011 | iKon-L SO DO936N-MW-BN |
| Single event spectroscopy on laser generated x-ray beams | C. Kern, M. Schnell, C. Spielmann | Institute of Optics and Quantum Electronics, University of Jena, Germany | 2010 | iKon-L SO DO936N-MW-BN |
| Spectral and spatial characterization of harmonics in the XUV region | S. Eyring, C. Kern, J. Lohbreier, R. Spitzenpfeil, C. Spielmann | Institute of Optics and Quantum Electronics, University of Jena, Germany | 2009 | DO420-BN1 |
| Time resolved X-Ray diffraction | I. Uschmann | Institute of Optics and Quantumelectronics, University of Jena, Germany | 2007 | DX420-BR-DD2 |
| Laserartige XUV-Strahlung: Charakterisierung und Handhabung von Gasharmonischen | A. Klein, D. Hemmers, G. Pretzler | Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany | 2006 | DO420-BN1 |
| Small angle scattering using XUV light from high-order harmonic generation | Ch. Weier, R. Adam, C. M. Schneider | Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany | 2014 | Newton SO DO920P-BN |
| Microscopy | ||||
| Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jet | M. Müller, K. Mann | Laser-Laboratorium Göttingen e.V., Optics / Short Wavelengths | 2017 | iKon-L SO DO936N-OW-BN |
| Coherent microscopy with soft X-rays | R. Heine, A. Rosenhahn | Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe, and Institute of Applied Physical Chemistry, University of Heidelberg, Germany | 2010 | DODX436-BN2 |
| Scattering | ||||
| Small angle scattering using XUV light from high-order harmonic generation | Ch. Weier, R. Adam, C. M. Schneider | Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany | 2014 | Newton SO DO920P-BN |
| Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA III | L. Müller, F. Westermeier, M. Sprung | Coherent X-Ray Scattering, DESY, Hamburg, Germany | 2013 | iKon-L SO DO936N-MW-BR-DD |
| Time-resolved resonant soft x-ray scattering with free-electron lasers | W. Schlotter1, F. Sorgenfrei2, M. Beye3, W. Wurth2 | 1Stanford Linear Accelerator Center, Menlo Park, USA 2Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany 3 Helmholtz Centre for Materials and Energy, Berlin, Germany | 2011 | iKon-L SO DO936N-MW-BN |
| Coherent diffraction imaging | ||||
| Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light source | L. Juschkin1,2, J. Bußmann1,2, L. Loetgering1, D. Rudolf1,2, S. Brose3, S. Danylyuk3, R. Xu4, J. Miao4 | 1Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany 2Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany 3Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany 4Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA | 2014 | iKon-M SO DO934P-BN |
| Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet source | S. Witte, V. T. Tenner, D. W. E. Noom, K. S. E. Eikema | Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands | 2014 | iKon-M SO DO934P-BN |
| Phase-contrast imaging | ||||
| Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymers | M. Hildebrand, M. Leck, M. Korth | Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany | 2013 | iKon-M SO DO934P-BR-DD |
| Interferometry | ||||
| XUV Interferometry using thin-film beam splitters | U. Zastrau1, V. Hilbert1, M. Wünsche1, S. Zhang1, C. Rödel1,2, E. Förster 2 | 1Institute of Optics and Quantum Electronics, University of Jena, Germany 2Helmholtz Institute Jena, Germany | 2012 | iKon-L SO DO936N-MZ-BN |
| Interferometry in the XUV spectral range using laser- generated high-order harmonics | D. Hemmers, G. Pretzler | Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe, and Institute of Applied Physical Chemistry, University of Heidelberg, Germany | 2006 | DO420-BN1 |
Remarks:
1DO420 replaced by Newton SO 920
2not available any more
3iDus SO replaced by Newton SO
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