04. September 2022  - 09. September 2022 Brno, Best Western Premier Hotel, Czech Republic


16th Multinational Congress on Microscopy

Visit our booth G2 where we will present our Correlative AFM and SEM system:

The AFSEM system from GETec enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market and can easily be added to your system.

Für Sie vor Ort:
Chris Schwalb
Chris Schwalb
Veranstaltungswebsite 16MCM


Quantum Design GmbH

Im Tiefen See 58
64293 Darmstadt

Telefon:+49 6151 8806-0
Fax:+49 6151 8806920