25. April 2023
- 26. April 2023
Leibniz IAMO in Halle, Germany
CAM Workshop 2023
Innovation in Failure Analysis and Material Diagnostics of Electronics ComponentsDr. Andreas Bergner will present the following systems:
- Correlative SEM-AFM analysis with the AFSEM from QD Microscopy
- Breakthrough x-ray analysis systems from Sigray (XRF, XAS, XRM,...)
- In-situ microscopy solutions (force, temperature, liquid,.....) from Deben and DENSSolutions
- Sputter & carbon coaters from Quorum
Meet us at booth 13!
Veranstaltungswebsite
CAM Workshop 2023
