Sample preparation for electron microscopy
Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.
Ion Milling Systems
Ion milling systems implement an Ar+ ion beam to polish the surface of the sample and make it suitable for particular electron microscope analyzes. The systems ...
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Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.
Ion Milling Systems
Ion milling systems implement an Ar+ ion beam to polish the surface of the sample and make it suitable for particular electron microscope analyzes. The systems support both cross-section milling and flat milling.
- Cross-section Milling: Used to produce wider, undistorted cross sections without applying mechanical stress to the sample
- Flat Milling: Used for removing surface layer artifacts and final polish after traditional mechanical polishing techniques.
Sample Cleaners
Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. For high quality electron analysis, it is necessary to remove this contamination from the surfaces with sample cleaners, which assure proper cleaning without damaging the samples.
Ion Sputter
An ion sputter increases the conductivity of non-conductive samples to prevent charging during electron microscope observation.
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The ion milling system ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications ...
Ion milling systems (IMS) utilize a (low-energy) Ar-ion beam to produce wide and undistorted cross-sections or in order to polish typical SEM samples - without applying mechanical stress to the ...
The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples. ZONE is an easy-to-use cleaner for pre-analysis sample preparation, ensuring the ...
The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
The GloQube Plus is a compact, easy to use, stand-alone glow discharge system. The primary application of the system is the hydrophilisation (wetting) of carbon-coated TEM support films and grids. ...
A vibratome uses a vibrating blade and not pressure to slice through tissue. This method causes little mechanical strain which enables the use of untreated (unembedded) samples. The PELCO easiSlicer ...
Critical point dryer K850 combines versatility and ease of operation. Built-in thermo-electric heating and adiabatic cooling allow precise temperature control. The vertical pressure chamber (32 mm in ...
Quorum’s critical point dryer model E3100 is well-established in many laboratories and has been used successfully for more than 40 years. Large valves and two large display instruments for pressure ...
The Qdry is Quorum's all new automated critical point dryer. It is easy to use and ensures consistent preparation results by running customised, stored recipes.
Ted Pella is the leading manufacturer of laboratory microwaves for tissue preparation in electron microscopy, histology and pathology. BioWave works with continuously generated microwaves, thus ...
The McIlwain TC752 tissue chopper has been specifically developed for the preparation of microscopic sections of small and irregularly shaped samples (biopsy, small organs etc.). The special design of ...
The plasma systems from plasma technology are ideal systems for laboratory as well as R&D use. The implemented KHz generator technique eliminates the need for sophisticated electronics and impedance ...
