We offer special measurement services for materials science and spectroscopy to you at our premises. You are welcome to use our state-of-the-art application lab for your measurements or benefit from the many years of experience we have in the above fields and let us do the measurements for you.
- Thickness measurements of transparent and semi-transparent thin films
- Optical constants of bulk samples and thin film systems by spectroscopic ellipsometry
- Particle sizing
- Molecular interactions on surfaces
- Viscoelastic properties of thin films
- QCM-D: Q-Sense Analyzer and Explorer
- Spectroscopic ellipsometry: J. A. Woollam RC2, VASE, Alpha-SE