Invitation: Correlative In-Situ Analysis by combination of AFM, SEM, and FIB

We cordially invite you to come and discuss with us on 9th July from 12:00 to 14:00 at the Institut Català de Nanociència i Nanotecnologia, Sala Auditori ICN2 in Barcelona.

  • Whole wafer imaging
  • Quantitative height measurements
  • Combined SEM /AFM imaging
  • Elasticity coefficient measuring and mapping
  • Sub-nanometer resolution on non-conducting samples

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Xavier Boira
Xavier Boira


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Quantum Design

Roca i Roca, 45
08226 Terrassa (Barcelona)

Phone:+34 937 349168
Fax:+34 937 349168
Xavier BoiraSales Manager
+34 937 349168
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