EclipseXRM – a high-class submicron XRM system
from SIGRAYThe EclipseXRM system offers the highest spatial resolution available on the market (0.3 µm with voxel size of <100 nm) combined with the new unique Tri-Contrast mode. Tri-contrast mode will give you simultaneously absorption, quantitative phase as well as darkfield contrast information.
- 3D XRM with <100 nm voxel size and spatial resolution of 0.5 µm
- Unique contrast options (Tri-Contrast mode)
- Several detection systems for a maximum resolution and FOV
Further information
Tri-Contrast Mode
The EclipseXRM gives you access to three unique and different detection modes. Absorption, quantitative phase and subresolution darkfield mode. Each mode will give new information regarding your sample which offers a complete new insight and opportunities for applications like battery research or failure analysis as well as Life Science questions.
Quantitative Phase™ contrast
The EclipseXRM is not only offering the traditional propagation phase contras mode but in addition the new and unique quantitative phase contrast. The normal propagation phase contrast is only a so-called edge-enhancing method while the new quantitative phase mode reveals direct information regarding the refraction index of your sample which will give you the possibility to differ between the density and the atomic number of the material. This is extremely helpful if you look at samples with a very low x-ray absorption contrast like biological or polymer samples.
Nanofocus x-ray source and Tri-Contrast x-ray source
The new EclipseXRM combines two different x-ray sources in one system. This will offer a maximum of flexibility and efficiency. All EclipseXRM sources are maintenance-free without the cost of consumables or requiring frequent downtimes for filament changes. The nanofocus x-ray source offer a resolution in the submicron range (0.5 µm) while the Tri-Contrast x-ray source offers access to three different contrast mechanisms.
As another alternative the EclipseXRM can be equipped with the breakthrough FAAST x-ray source from Sigray. This source can be setup with 5x different target materials (like Cr, Cu, Rh, W, Mo, Au, Ti, Ag,…) which will result in a true multi-energy source. Each target material can be selected via software without the need of any hardware changes.
Specifications
| Parameter | Specification |
| Dual Modes | Absorption Mode | Submicron resolution at large working distances Tri-Contrast Mode | Absorption, Quantitative PhaseTM, and Subresolution DarkfieldTM acquired simultaneously |
| Spatial Resolution[a] | Submicron (0.5 μm) in Absorption Mode <3 μm Microns in Tri-Contrast Mode |
| Source(s) | Sealed Tube Transmission | Additional Patented Sigray Microstructured Source (optional) |
| Target | Tungsten on diamond substrate | Patented target with microstructured metals embedded in diamond in secondary Sigray source |
| Voltage | 30 - 160 kV |
| X-ray detectors | Multiple detector system. Enables rapid changing of FOV and resolution modes |
| Scintillator-coupled objectives | 0.4X, 4X, 20X, and 40X objectives[b], 2k x 2k CCD detector |
| Large FOV detector | Choice of flat panel detector[c] for increased FOV or photon-counting detector[d] for high throughput for high x-ray energies and energy thresholding. Custom sizes upon request. |
| Tri-Contrast Design Energy | 20, 30, 40[e], and 50 keV[e] |
| Stage | 100 x 100 x 100 mm XYZ High precision air bearing rotary stage with up to 25 kg load |
| Software | Sigray3D Intuitive Software. Optional ORS Dragonfly and/or Avizo Data Analysis Advanced algorithms for improved reconstruction time and quality |
[a] Spatial resolution for absorption mode measured with 2D resolution target, normal field mode, optional 40X objective
[b] 4X and 20X objectives are standard. 0.4X and 40X objectives are optional
[c] Flat panel standard option is 2304 x 2904, with 50 um pixels. Larger formats are available upon request.
[d] Photon-counting detector comes in three formats: 1k x 0.5k at 40 Hz with CdTe, 1k x 1k 100 Hz CdTe, and 1k x 2k 20 Hz CdTe. CdTe enables high efficiency at high energies.
[e] 40 and 50 keV tri-contrast requires optional patented Sigray microstructured x-ray source
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Quantum Design
Roca i Roca, 45
08226 Terrassa (Barcelona)
Spain
| Phone: | +34 937 349168 |
| Fax: | +34 937 349168 |
| E-mail: | iberiaqd-europe.com |
