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High Resolution AFM (HR-AFM)
To measure sub-nanometer surface featuresThe HR-AFM is an advanced, yet affordable AFM for researchers that need the highest resolution scanning capabilities.
The HR is ideal for researchers that want to visualize and measure sub-nanometer surface features
- Less than 35 picometers of Z noise
- Top-view and side-view video optics
- Choice of three interchangeable scanners
- 28 bit XY scanning
Downloads
Contact
Séverine
Dubroecq
