Invitation: Correlative In-Situ Analysis by combination of AFM, SEM, and FIB

We cordially invite you to come and discuss with us on 9th July from 12:00 to 14:00 at the Institut Català de Nanociència i Nanotecnologia, Sala Auditori ICN2 in Barcelona.

  • Whole wafer imaging
  • Quantitative height measurements
  • Combined SEM /AFM imaging
  • Elasticity coefficient measuring and mapping
  • Sub-nanometer resolution on non-conducting samples

More information on https://icn2.cat/en/

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Quantum Design S.A.R.L.

1 avenue de l’Atlantique
Bâtiment Mac Kinley
91940 Les Ulis
France

Tél. :01 69 19 49 49
Fax :01 69 19 49 30
Email :france@qd-europe.com