- Whole wafer imaging
- Quantitative height measurements
- Combined SEM /AFM imaging
- Elasticity coefficient measuring and mapping
- Sub-nanometer resolution on non-conducting samples
More information on https://icn2.cat/en/
More information on https://icn2.cat/en/
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Quantum Design S.A.R.L.
Avenue de l’Atlantique
Bâtiment Fuji Yama
91940 Les Ulis
France
Tél. : | 01 69 19 49 49 |
Email : | franceqd-europe.com |