We cordially invite you to come and discuss with us on 9th July from 12:00 to 14:00 at the Institut Català de Nanociència i Nanotecnologia, Sala Auditori ICN2 in Barcelona.

• Whole wafer imaging
• Quantitative height measurements
• Combined SEM /AFM imaging
• Elasticity coefficient measuring and mapping
• Sub-nanometer resolution on non-conducting samples

More information on https://icn2.cat/en/