We now offer a laser alignment and assembly station (LAS) that allows a sub-micron determination of lens centration and tilt. LAS consists of a laser source, a rotating sample holder and detector unit.
The lens or optic is measured in reflection.
Besides unparalleled hardware performance, LAS features user-friendly CalcuLens software for easy handling of the system and simple data analysis.
The system can be used in a broad spectral range from the deep UV to the longwave infrared, which makes it perfectly suitable for a great variety of applications. Typical materials analyzed with LAS are optical crown, flint or fused silica.
Crystals and more exotic materials like magnesium and calcium fluoride or germanium are also possible. Apart from complex, multi-spectral alignment systems, we offer benchtop systems for high throughput and small budgets.
|Laser reflection, assembly and inspection|
|Laser wavelengths||532 nm; 650 nm; 1.55 µm, 2.94 µm; 10.6 µm|
|Resolution||To 0.1 µm TIR|
|Curvature radius ± 2 mm to ∞ with one objective|
|Confocal and normal reflection|
|Interferometric distance measurements to determine lens center thickness and air gaps|
|Z-height accuracy||1.0 µm|
|Scanning range||200 mm|
|Working distance||400 mm|
|Laser source||1.31 µm|