![Zygolot NewV-iew Portable Profiler Zygolot NewV-iew Portable Profiler](/fileadmin/_processed_/4/f/csm_E19_ja_zygolot_NewV-iew_Portable-profiler_8a2ba3589e.png)
- Measures both smooth and rough optics
- Can measure step heights and diffractive surfaces up to 80μm
- Uses ZYGO proprietary SureScan acquisition technology to enable low uncertainty metrology in the presence of vibration
- The asymmetric design enables metrology near the outside edge of a large optic
- Integrated focus aid simplifies alignment
- Can use large range of standard ZYGO microscope objectives From 2.75x to 100x
- Operates on Zygo’s new Mx metrology software