Notre partenaire AFMworkshop

Nano-Profiling AFM (NP-AFM)

For process control and development

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

Plus d'informations

The NP-Atomic Force Microscope is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples in order to create perfect nanoscience instrument for nano imaging and analysis.



Lionel Sudrie
Lionel Sudrie


Quantum Design S.A.R.L.

1 avenue de l’Atlantique
Bâtiment Mac Kinley
91940 Les Ulis

Tél. :01 69 19 49 49
Fax :01 69 19 49 30
Lionel SudrieGérant
01 69 19 49 49