Do you have difficult AFM and SEM samples?

Our FusionScope provides you with a completely new analysis system in the field of atomic force microscopy (AFM) and electron microscopy (SEM). With its correlative approach, the FusionScope offers completely new possibilities for both types of microscopy and can, in some circumstances, make the difference for samples that are difficult to measure.
Do you have AFM samples that are difficult or impossible to measure with a conventional AFM because of their geometry? Or SEM samples of which you would like to know the local topography or the mechanical, electrical or magnetic properties in detail?
Then please contact us. We are always looking for difficult samples and would be pleased to possibly offer you a solution.

More about correlative AFM/SEM Microscopy Platform

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Dr. Chris Schwalb
Dr. Chris Schwalb
Dr. Cecilia Ocsovainé Steinbach
Dr. Cecilia Ocsovainé Steinbach

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Quantum Design GmbH

Eszak u. 24
H-1038 Budapest
Hungary

Phone:+36 1 2402711
Fax:+36 1 2402711
E-mail:hungary@qd-europe.com
Dr. Chris SchwalbCOO at QD Microscopy GmbH
+49 6157 80710-661
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Dr. Cecilia Ocsovainé SteinbachSales Manager
+36 20 4311496
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