Contact
en
1
Products
(current)
Magnetism
Magnetic field measurements
Magnetic separator (SHGMS)
Magnetometers
Measurement Platform with Electro-Magnet
Power supply for superconducting magnets
Materials science
3D Confocal Raman microscopes
Atomic force microscopes (AFM)
Correlative Microscopy – Raman/AFM/SNOM/SEM
Flexus thin film stress measurement systems
Furnace for crystal fabrication
Hall effect
Laser Interferometers
Material optical properties
Micro-computed tomography scanners for materials science
Motion control systems
Nanoindenters - Nanohardness tester
Particle size analyzer
Photo lithography systems
Portable Optical Profilers
Spectroscopic ellipsometers
Spin coater
Systems to measure physical properties
Thermoelectric measurements
Very-low resistance measurements
Spectroscopy
3D Confocal Raman microscopes
Calibration of optical detectors
Cameras and detectors for time-resolved spectroscopy and imaging
Correlative Microscopy – Raman/AFM/SNOM/SEM
Czerny-Turner monochromators
Detectors for modular spectroscopy
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Imaging spectrographs
Low-temperature Raman microscope
Modular optical spectroscopy
Motion control systems
Raman and luminescent high resolution portable spectrometers
Spectrographs
Spectroscopic ellipsometers
UV-NIR Spectroradiometer
Imaging
3D Confocal Raman microscopes
CCD, EMCCD and sCMOS cameras for imaging
Cameras and detectors for time-resolved imaging and spectroscopy
Cameras for EUV, X-ray and high-energy particle detection
Correlative Microscopy – Raman/AFM/SNOM/SEM
High-end thermography cameras
Highest speed cameras
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Imaging Polarimeters
Imaging spectrographs
Longwave thermography cameras
Scanning nearfield optical microscopes (SNOM)
Thermographic NDT and NDE
UAV cameras
X-ray analytical instrumentation
X-ray sources
X-ray windows
Electron microscopy
AFSEM - correlative AFM and SEM
Cathodoluminescence and Correlative Microscopy
Focused Ion Beam Systems (FIB/FIB-SEM)
In situ TEM solutions
RISE microscopy
SEM/FE-SEM/Nano-probing
Sample Preparation
TEM (Transmission Electron Microscopes)
Cryogenics
CCR Cryogenic Cold Traps
Cryogenic probe stations
Cryogenic temperature control
Cryostats
Dewars
Helium recovery and liquefaction
Level instrumentation
Optical cryostats
Pulse Tube Cryocoolers
Superconducting Magnet Systems
Optics
Astronomy/UBVRI filters
Bandpass filters
Colored glass filters & sets
Dichroic filters & sets
Filter accessories
Filters for fluorescence and Raman spectroscopy
Heat control filters
Infrared filters
Manual stages and holders
Motion control systems
Neutral density filters
Optical tables and breadboards
Optics and optical coatings
Polarizer and beamsplitters UV-IR
Quartz lenses & glass lenses
Short and longpass filters
Light & lasers
Characterization of optical radiation sources
High quality laser diodes and LED light sources
Laser beam diagnostic systems for industrial applications
Laser beam diagnostics
Laser diode modules
Laser power measurements
Light measurement
Light sources for scientific applications
Motion control systems
Picosecond and femtosecond fiber lasers
Portable spectroradiometers
Life sciences
3D Confocal Raman microscopes
Atomic Force Microscopes (AFM) for Life Sciences
Correlative Microscopy – Raman/AFM/SNOM/SEM
Filters for fluorescence analytics
High quality laser diodes and LED light sources
High-throughput cellular imagers
Light sources for scientific applications
Micro-computed tomography scanners for life sciences
Motion control systems
Optical tweezers
Picosecond and Femtosecond lasers for biophotonics
Scanning nearfield optical microscopes (SNOM)
Surface plasmon resonance (SPR) instruments
Education
Educational equipment for schools and universities
Products for industry
Cryogenic temperature control
High quality laser diodes and LED light sources
Highest speed cameras
Laser beam diagnostic systems for industrial applications
Laser beam diagnostics
Laser diode modules
Laser power measurements
Level instrumentation
Light measurement
Micro-computed tomography scanners for materials science
Motion control systems
Particle size analyzer
Portable Optical Profilers
Portable spectroradiometers
Thermographic NDT and NDE
Service
(current)
Technical & application support
Materials science, spectroscopy & electron microscopy measurements
Magnetometer measurements
Team Viewer Online Support for Spectroscopic Ellipsometers
ServicePRO for Quantum Design Systems
Service Parts Quantum Design
News
(current)
Latest updates
SPECTRUM newspaper subscription
Product & application news - SPECTRUM
Events
(current)
About us
(current)
Our company
Offices worldwide
Contact
Our partners
ISO 9001
Contact
en
1
Products
(current)
Magnetism
Magnetic field measurements
Magnetic separator (SHGMS)
Magnetometers
Measurement Platform with Electro-Magnet
Power supply for superconducting magnets
Materials science
3D Confocal Raman microscopes
Atomic force microscopes (AFM)
Correlative Microscopy – Raman/AFM/SNOM/SEM
Flexus thin film stress measurement systems
Furnace for crystal fabrication
Hall effect
Laser Interferometers
Material optical properties
Micro-computed tomography scanners for materials science
Motion control systems
Nanoindenters - Nanohardness tester
Particle size analyzer
Photo lithography systems
Portable Optical Profilers
Spectroscopic ellipsometers
Spin coater
Systems to measure physical properties
Thermoelectric measurements
Very-low resistance measurements
Spectroscopy
3D Confocal Raman microscopes
Calibration of optical detectors
Cameras and detectors for time-resolved spectroscopy and imaging
Correlative Microscopy – Raman/AFM/SNOM/SEM
Czerny-Turner monochromators
Detectors for modular spectroscopy
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Imaging spectrographs
Low-temperature Raman microscope
Modular optical spectroscopy
Motion control systems
Raman and luminescent high resolution portable spectrometers
Spectrographs
Spectroscopic ellipsometers
UV-NIR Spectroradiometer
Imaging
3D Confocal Raman microscopes
CCD, EMCCD and sCMOS cameras for imaging
Cameras and detectors for time-resolved imaging and spectroscopy
Cameras for EUV, X-ray and high-energy particle detection
Correlative Microscopy – Raman/AFM/SNOM/SEM
High-end thermography cameras
Highest speed cameras
Hyperspectral cameras
Hyperspectral remote sensing systems
Hyperspectral systems
Imaging Polarimeters
Imaging spectrographs
Longwave thermography cameras
Scanning nearfield optical microscopes (SNOM)
Thermographic NDT and NDE
UAV cameras
X-ray analytical instrumentation
X-ray sources
X-ray windows
Electron microscopy
AFSEM - correlative AFM and SEM
Cathodoluminescence and Correlative Microscopy
Focused Ion Beam Systems (FIB/FIB-SEM)
In situ TEM solutions
RISE microscopy
SEM/FE-SEM/Nano-probing
Sample Preparation
TEM (Transmission Electron Microscopes)
Cryogenics
CCR Cryogenic Cold Traps
Cryogenic probe stations
Cryogenic temperature control
Cryostats
Dewars
Helium recovery and liquefaction
Level instrumentation
Optical cryostats
Pulse Tube Cryocoolers
Superconducting Magnet Systems
Optics
Astronomy/UBVRI filters
Bandpass filters
Colored glass filters & sets
Dichroic filters & sets
Filter accessories
Filters for fluorescence and Raman spectroscopy
Heat control filters
Infrared filters
Manual stages and holders
Motion control systems
Neutral density filters
Optical tables and breadboards
Optics and optical coatings
Polarizer and beamsplitters UV-IR
Quartz lenses & glass lenses
Short and longpass filters
Light & lasers
Characterization of optical radiation sources
High quality laser diodes and LED light sources
Laser beam diagnostic systems for industrial applications
Laser beam diagnostics
Laser diode modules
Laser power measurements
Light measurement
Light sources for scientific applications
Motion control systems
Picosecond and femtosecond fiber lasers
Portable spectroradiometers
Life sciences
3D Confocal Raman microscopes
Atomic Force Microscopes (AFM) for Life Sciences
Correlative Microscopy – Raman/AFM/SNOM/SEM
Filters for fluorescence analytics
High quality laser diodes and LED light sources
High-throughput cellular imagers
Light sources for scientific applications
Micro-computed tomography scanners for life sciences
Motion control systems
Optical tweezers
Picosecond and Femtosecond lasers for biophotonics
Scanning nearfield optical microscopes (SNOM)
Surface plasmon resonance (SPR) instruments
Education
Educational equipment for schools and universities
Products for industry
Cryogenic temperature control
High quality laser diodes and LED light sources
Highest speed cameras
Laser beam diagnostic systems for industrial applications
Laser beam diagnostics
Laser diode modules
Laser power measurements
Level instrumentation
Light measurement
Micro-computed tomography scanners for materials science
Motion control systems
Particle size analyzer
Portable Optical Profilers
Portable spectroradiometers
Thermographic NDT and NDE
Service
(current)
Technical & application support
Materials science, spectroscopy & electron microscopy measurements
Magnetometer measurements
Team Viewer Online Support for Spectroscopic Ellipsometers
ServicePRO for Quantum Design Systems
Service Parts Quantum Design
News
(current)
Latest updates
SPECTRUM newspaper subscription
Product & application news - SPECTRUM
Events
(current)
About us
(current)
Our company
Offices worldwide
Contact
Our partners
ISO 9001
Quantum Design Europe
Current selection
Typ
Period
Contact
Navigation
Service
News
Events
About us
Categories
Magnetism
Materials science
Spectroscopy
Imaging
Electron microscopy
Cryogenics
Optics
Light & lasers
Life sciences
Education
Products for industry
Contact
Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
Phone:
+39 06 5004204
Fax:
+39 06 5010389
E-mail:
italy@qd-europe.com
×
Italiano
English
Content cannot be displayed, please allow preferences cookies.
Content cannot be displayed, please allow statistics cookies.
Content cannot be displayed, please allow marketing cookies.
Video content cannot be displayed, please allow the marketing cookies.