Materials science
- Magnetism
- Materials science
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Laser Interferometers
- Micro-computed tomography scanners for materials science
- Nanoindenters - Nanohardness tester
- Particle size analyzer
- Photo lithography systems
- Portable Optical Profilers
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
- Education
- Products for industry
Systems to characterize magnetic, mechanical, optical and thermal material properties