Materials science

Characterisation of physical properties

Electrical measurements

Hall effect

Material optical properties

Systems to measure physical properties

Furnace for crystal fabrication

Furnace for crystal fabrication

Interferometers

Laser Interferometers

Microscopy

3D Confocal Raman microscopes

Atomic force microscopes (AFM)

Correlative Microscopy – Raman/AFM/SNOM/SEM

Scanning nearfield optical microscopes (SNOM)

Motion control systems

Motion control systems

Particle size analyzers

Particle size analyzers

Photo lithography systems

Photo lithography systems

Potentiostats and Galvanostats for Electrochemistry

Potentiostats and Galvanostats for Electrochemistry

Preparation and characterisation of thin films

Flexus thin film stress measurement systems

Nanoindenters - Nanohardness tester

Spectroscopic ellipsometers

Spin coater

Systems for solar cell characterization

Profiler

Portable Optical Profilers

Tomography

Micro-computed tomography scanners for materials science