Invitation: Correlative In-Situ Analysis by combination of AFM, SEM, and FIB

We cordially invite you to come and discuss with us on 9th July from 12:00 to 14:00 at the Institut Català de Nanociència i Nanotecnologia, Sala Auditori ICN2 in Barcelona.

  • Whole wafer imaging
  • Quantitative height measurements
  • Combined SEM /AFM imaging
  • Elasticity coefficient measuring and mapping
  • Sub-nanometer resolution on non-conducting samples

More information on https://icn2.cat/en/

Contact

Register

Newsletter registration

Contact

Quantum Design Turkiye

Sakarya Mah. Bassehir Sk. 14/A
06230 Altindag / Ankara
Turkey

Phone:+90 532 3205241
E-mail:turkeyqd-europe.com