14. Juni 2022
- 15. Juni 2022
Halle, Germany / Booth 15
9th CAM-Workshop
Innovation in Failure Analyses and Material Diagnostics of Electronics ComponentsWe will present the correlative AFM and SEM system - the AFSEM.

Chris
Schwalb
Dr.
Andreas
Bergner
Produkt Manager - Elektronenmikroskopie & Nanotechnologie
| +49 6157 80710-12 | |
| +49 6157 80710912 | |
| E-Mail schreiben |

Dr.
Andreas
Bergner
