Eclipse XRM – the new standard in X-ray tomography
Eclipse XRM from Sigray is the first non-lens-based XRM that reaches 300 nm spatial resolutions. In addition, it provides a very good material contrast for both biological and soft/light materials (e.g. polymers) and samples from the semiconductor industry and geological research. It is one of the most versatile XRM systems on the market.
Previous leading 3D XRM/MicroCT. 3D X-ray microscopy with 0.5 μm spatial resolution of sciatic nerve cells
The leading resolution of EclipseXRM. New functions with a spatial resolution of 0.3 μm, almost a 2-fold improvement in resolution
Outstanding image quality: Sigray EclipseXRM offers true 300 nm resolution and clearly superior contrast for a wide range of samples, from large intact circuit boards (see above) to geological and biological samples.
Eclipse XRM can be fitted with up to two x-ray tubes and various detector systems (flat panel, lens-based detectors and others).
This internal structure makes it ideal for integrating a wide range of in-situ stages. It can achieve a spatial resolution of <500 nm even at a working distance of 50 mm.
Phase contrast mode, offset tomography and the ability to perform spiral scans round off the overall package. Intuitive software equipped with the latest machine learning options is available for evaluating the measurement data.
Contact us for initial test measurements.
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