AFSEM-Rasterkraftmikroskop für korrelative AFM- und REM-Messungen

Have a look at this latest Webinar held by Chris Schwalb about In-Situ Nanoscale Chracterization of electrical an magnetic properties of 3D nanostructures by Combination of AFM, SEM & FIB

AFSEM-Rasterkraftmikroskop für korrelative AFM- und REM-Messungen - AFSEM nano
AFSEM nano

AFSEM nano is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the ...

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