AFSEM-Rasterkraftmikroskop für korrelative AFM- und REM-Messungen
Have a look at this latest Webinar held by Chris Schwalb about In-Situ Nanoscale Chracterization of electrical an magnetic properties of 3D nanostructures by Combination of AFM, SEM & FIB
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM ...
Mit dem AFSEM-Rasterkraftmikroskop (AFM) können zwei der leistungsfähigsten Oberflächenanalysemethoden, AFM und REM, schnell und einfach miteinander kombiniert werden. Mit nur einem ...
SCL-Sensor.Tech develops and manufactures silicon piezo-resistive self-sensing cantilevers. This type of all-electrical cantilever allows completely new applications in the fields of AFM, nanoprobing, ...