AFSEM - correlative AFM and SEM
- Materials science
- Spectroscopy
- Imaging
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ TEM solutions
- In situ stages for electron microscopy and µXCT
- Sample preparation for electron microscopy
- Sputter & carbon coaters
- Tabletop- and Compact-Scanning Electron Microscopes
- Cryogenics
- Optics
- Light & lasers
- Life sciences
AFSEM - correlative AFM and SEM
The AFSEM system enables you to combine the possibilities of your SEM with the capabilities of an atomic force microscopy (AFM). The AFSEM is compatible with most SEM and FIB/SEM systems on the market ...
Self-sensing cantilevers
SCL-Sensor.Tech develops and manufactures silicon piezo-resistive self-sensing cantilevers. This type of all-electrical cantilever allows completely new applications in the fields of AFM, nanoprobing, ...