Analysis of vitamin C tablets using combined SEM and AFM techniques

In pharmaceutical research, understanding the surface properties of vitamin C tablets is crucial for optimizing their administration.
These properties are usually investigated using scanning electron microscopy (SEM) and atomic force microscopy (AFM). SEM provides detailed information about surface morphology, while AFM measures surface roughness at the nanoscale. However, the combination of these techniques presents a challenge, especially when it comes to particles in the nanometer range.
Conventional AFM has difficulty positioning its tip on such small particles due to the limitations of optical microscopy and the roughness of the tablet surface, leading to potential contamination and inaccurate data. Also, while SEM alone can visualize surface morphology, it cannot provide the detailed surface roughness data that AFM offers.
With the FusionScope, researchers can easily identify specific particles with the SEM and then guide the AFM tip to the exact location where they want to make detailed surface roughness measurements. The combined analytical approach and universal coordinate system eliminates the need for sample transfer between instruments, reducing the risk of contamination and improving the efficiency of the analysis.

Advantages and results

Using FusionScope simplifies the process of nanoscale analysis by integrating multiple techniques into a single, easy-to-use platform. It reduces the time required for data acquisition and minimizes the risk of contamination or damage to the AFM tip. It also provides comprehensive, correlative analysis of particle properties, which is critical for optimizing the design and functionality of pharmaceutical tablets such as vitamin C.
By improving the accuracy and efficiency of particle analysis, FusionScope represents a significant advance in the field of pharmaceutical research and provides scientists in research institutes and industry alike with a powerful tool.

More about easy-to-use Correlative AFM/SEM Microscopy Platform

Contact

Marion Wolff
Marion Wolff

Register

Newsletter registration

Contact

Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
E-mail:germanyqd-europe.com
Marion WolffIndustrial Engineer
+49 6157 80710-663
Write e-mail