Accessories for SEM applications
- Magnetism
- Materials science
- Spectroscopy
- Imaging
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ TEM solutions
- In situ stages for electron microscopy and µXCT
- Sample preparation for electron microscopy
- Sputter & carbon coaters
- Tabletop- and Compact-Scanning Electron Microscopes
- Cryogenics
- Optics
- Light & lasers
- Life sciences
Airlock with coldstage
CoolLok PP3006 is a combination of a sample port and cold stage/cold trap. The system offers fast specimen launch into an REM and sample cooling down to -190 °C (± 0.5 °C). At normal operating ...
SEM beam blanking
Beam blanking, pulsing or otherwise modulating the electron beam for different SEM systems from Hitachi or JEOL
Vacuum electrical feed through flange
Standard 14 way electrical feed through vacuum flange. We also offer custom flanges within 6-8 weeks delivery time.
Chamberscope for SEM
The chamberscope offers a detailed view of sample and measurement chamber.
