Flexus thin film stress measurement systems

Flexus thin film stress measurement systems - FLX Flexus thin film stress measurement systems
FLX Flexus thin film stress measurement systems

Toho FLX thin film stress measurement systems allow the determination of stresses and the linear expansion coefficient of thin and thick films on silicon wafers and other substrate materials. The ...

Contact

Quantum Design GmbH

Breitwieserweg 9
64319 Pfungstadt
Germany

Phone:+49 6157 80710-0
Fax:+49 6157 807109
E-mail:germanyqd-europe.com