Flexus thin film stress measurement systems
- Magnetism
- Materials science
- Dip coater
- Electrospinning and electrospraying equipment
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Langmuir-Blodgett systems
- Material optical properties
- Nanoindenters - Nanohardness tester
- Particle size analyzer
- Photo lithography systems
- QCM-D Quartz Crystal Microbalance
- Spectroscopic ellipsometers
- Spin coater
- Systems for solar cell characterization
- Systems to measure physical properties
- Very-low resistance measurements
- Spectroscopy
- Imaging
- Electron microscopy
- Cryogenics
- Optics
- Light & lasers
- Life sciences
FLX Flexus thin film stress measurement systems
Toho FLX thin film stress measurement systems allow the determination of stresses and the linear expansion coefficient of thin and thick films on silicon wafers and other substrate materials. The ...