Do you have difficult AFM and SEM samples?

Our FusionScope provides you with a completely new analysis system in the field of atomic force microscopy (AFM) and electron microscopy (SEM). With its correlative approach, the FusionScope offers completely new possibilities for both types of microscopy and can, in some circumstances, make the difference for samples that are difficult to measure.
Do you have AFM samples that are difficult or impossible to measure with a conventional AFM because of their geometry? Or SEM samples of which you would like to know the local topography or the mechanical, electrical or magnetic properties in detail?
Then please contact us. We are always looking for difficult samples and would be pleased to possibly offer you a solution.

More about correlative AFM/SEM Microscopy Platform


Nicolas Tcherbak
Nicolas Tcherbak


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Quantum Design S.A.R.L.

1 avenue de l’Atlantique
Bâtiment Mac Kinley
91940 Les Ulis

Tél. :01 69 19 49 49
Nicolas TcherbakDirecteur Commercial
01 69 19 49 49
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