The Zygo portable profiler – Key features

  • Measures both smooth and rough optics
  • Can measure step heights and diffractive surfaces up to 80μm
  • Uses ZYGO proprietary SureScan acquisition technology to enable low uncertainty metrology in the presence of vibration
  • The asymmetric design enables metrology near the outside edge of a large optic
  • Integrated focus aid simplifies alignment
  • Can use large range of standard ZYGO microscope objectives From 2.75x to 100x
  • Operates on Zygo’s new Mx metrology software

The ZYGO portable profiler offers a more complete solution for the measurement of large optics.

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com