AccuFiz Series Fizeau interferometers – Models H100S and H150S High Resolution
from 4D TechnologyThe AccuFiz H, models H100S and H150S, with the 9 MP HR camera provide the highest available fringe resolution for measuring steep slopes, aspheric surfaces, and small diameter optics. The 3000 x 3000, high resolution camera captures the highest slopes of any commercial interferometer. With high slope range capability, you can have optical metrology of aspheres, freeform optics and highly aberrated elements.
Available with 4” or 6” aperture and stabilized laser sources to provide higher power and a longer coherence length, the AccuFiz H Fizeau interferometers, models H100S and H150S, come with the HeNe laser as standard in a full kit including the mainframe, the workstation and 4Sight advanced software for taking measurements and analyzing data.
The AccuFiz is a Fizeau interferometer extremely easy to use in confined lab spaces. Its compact, lightweight design is extremely rigid for maximum stability in any orientation or environment.
In production environments as well as in the lab the AccuFiz provides industry leading repeatability. Only AccuFiz includes Smart Zoom™ to ensure accurate lateral resolution over the entire 1X–10X zoom range.
On the shop floor or in a clean room, optional Dynamic Interferometry® enables exposure times down to 10 μs, so you can measure despite vibration, without isolation.
- Fizeau Interferometer System
- Phase Shifting and Vibration-Insensitive Dynamic Modes
- 4Sight™ Data Analysis and Visualization Software
- Mounting Configurations Horizontal or vertical (look-down)
- Optional Wireless Remote Control from Network Devices
- Surface Isolation Option to Measure Plane Parallel Surfaces
- Optional 33 to 600 mm Aperture Converters
- Optional Laser Sources: 355, 532, 1053, 1064 and 1550 nm wavelengths; additional wavelengths to 10.6 μm
Further information
The AccuFiz allows you to adjust the diameter of the light source to minimize measurement artifacts such as diffraction rings while maintaining adequate fringe contrast.
A typical interferometer offers only point source illumination while the AccuFiz allows the source size to be adjusted continuously between point source and approximately 2mm. In general, a large source size will minimize measurement artifacts such as diffraction rings which may be caused by imperfections in the optical system (dust, pits) or stray reflections from optical surfaces. However, a larger source size will also reduce fringe contrast for large cavities. Therefore, any given test setup has an optimum source size to minimize artifacts while preserving the fringe contrast for a given cavity size.
Typical artifact suppression due to dust on an optic
Surface Isolation Source option
4D’s Surface Isolation Source is an optional, additional external short coherence laser source that excludes all but the surface of interest making straightforward to measure flat, transparent optics with physical thickness as small as 150 microns.
Plane-parallel optics are transparent components with parallel faces, or optical systems with two or more parallel surfaces. Measuring any one surface with an interferometer is extremely difficult or impossible, as all parallel surfaces contribute fringes to the interferogram.
The SIS module lets you measure both surfaces of a transparent optic with a standard AccuFiz interferometer. You can also calculate transmitted wavefront error, optical thickness and homogeneity, all from a single measurement setup.
The adjustable path match mechanism provides additional flexibility, letting the operator dial in any surface that is within 88 to 112 millimeters in front of the aperture.
The Surface Isolation Source is a 635-640 nm diode fiber-coupled to the AccuFiz interferometer.
AccuFiz Fizeau Interferometer with Surface Isolation Source
How to measure optical components
4D Technology has been helping optics professionals to accurately measure optics for over 20 years: check the optical testing setups guide where they bring together all of that expertise, to help you make the best measurements in any environment!
Specifications
- 4- or 6-inches apertures
- 9 MP (3000 x 3000 pixels); 12-bit dynamic range
- Laser Source: 632.8 nm HeNe stabilized laser.
- Acquisition Mode: Temporal Phase Shifting; optional Dynamic Measurement
- Artifact Suppression: Adjustable Extended Source for Extremely Low Noise
- Fringe Resolution: > 1250
- Zoom: Continuous 1–10X Smart Zoom with pan, calibrated at all zoom settings
- Reference & Return Optics: compatible with all bayonet mount flats and spheres.
- Broad range of F/# and aperture sizes
Applications
- Optical Metrology for Precision Machining, Photovoltaic, Semiconductor, Optics, Automotive and Defense & Aerospace Industry
- Wavefront transmission quality measurements
- Optical systems alignment
- Surface form measurements of spherical and flat optics
- Radius of curvature measurements of spherical optics
- Surface form measurements on super-finished parts
- Flatness measurements on mechanical components and sealing surfaces.
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Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
| Phone: | +39 06 5004204 |
| Fax: | +39 06 5010389 |
| E-mail: | italy@qd-europe.com |
