Diffuse reflectance accessory - Selector
From SpecacThe Selector diffuse reflectance accessory enables solid samples to be analysed without the need for extensive sample preparation. The optimised off-axis configuration of the selector optics reduces unwanted directional reflection to a minimum. Selector almost exclusively collects diffuse reflection, which is particularly relevant for quantitative analysis. A special 45° tilted sample holder enables total reflection of a sample to be analysed.
- Measurement of diffuse or total reflection
- Macro, micro and tilted sample cup
- Simple sample handling
Further information
The diffuse reflectance accessory comes complete with micro sample cup, two standard sample cups and a tilted sample cup for total reflectance measurement. In addition, the system comprises a sample holder coated with a nickel diamond abrasive pad. This enables surface samples to be removed from tins, tubes, etc. and analysed directly in the optical path of the reflectance unit. The benefit provided by a nickel diamond lies in a very low spectral background compared to the commonly used SiC.
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Quantum Design s.r.l.
Via di Grotta Perfetta, 643
00142 Roma
Italy
| Phone: | +39 06 5004204 |
| Fax: | +39 06 5010389 |
| E-mail: | italy@qd-europe.com |
