NanoCam HD Optical Profiler
from 4D TechnologyThe NanoCam HD non-contact optical profiler measures surface roughness on supersmooth optics and precision surfaces. The NanoCam HD is a movable optical detection unit that can be positioned by hand or robotically. The compact and lightweight measurement head is highly flexible and can measure roughness anywhere on large optics, mirror segments or small optics.
The NanoCam HD optical profilometer utilizes Dynamic Interferometry® and, because the acquisition time is so short, the NanoCam HD can measure despite vibration.
- Vibration insensitive dynamic operation
- Workstation, gantry, robot mountable Interfaces
- 0.9X to 50X LWD interferometric objectives
- Extended Cables 5 m standard, 10 m optional
- Optional motorized, joystick-controlled tip/tilt/Z tripod
Further information
The NanoCam™ HD dynamic profiler measures surface roughness on small to meter scale coated and uncoated optics, as well as precision metals, plastics, and other polished specular surfaces with sub-angstrom level repeatability and precision.
With unmatched flexibility, the light weight NanoCam HD can be easily positioned on large parts by hand or mounted on a gantry or robotic arm to measure the surface finishing:
- anywhere on large surfaces
- inside production stations and polishing equipment
- multiple parts arrayed on a table
- directly on large optics and mirror segments
Portability and on-machine capability significantly reduce the handling and transportation of large optics, increases throughput and dramatically reduces the risk of damage to expensive, critical optics.
The NanoCam HD surface roughness profiler utilizes Dynamic Interferometry®, with a high-speed optical sensor that measures thousands of times faster than traditional profilers. Because acquisition time is so short, the NanoCam HD can measure despite vibration, making it possible to mount the instrument on a gantry or robot end effector as well as inside of a polishing station to measure polishing quality.
New autofocus capability allows for faster, more consistent measurements requiring fewer manual adjustments. Measure parts with reflectivity from 0.5% to 100% without changing reference optics. Single cable, power-over-ethernet operation can be combined with high-speed innovative software for data acquisition and analysis in a laptop environment for added portability.
NanoCam HD Dynamic Optical Profilers include 4Sight Focus advanced analysis software. Industry-leading 4Sight Focus software reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking and import/export functions.
Specifications
- Acquisition Mode Instantaneous phase shifting with pixelated phase sensor
- 5 Megapixel, 3.45 µm, 12-bit, low-noise camera
- High speed auto-focus
- 460 nm pulsed LED source
- Sample Reflectivity 0.5% - 100%
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Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
| Phone: | +39 06 5004204 |
| Fax: | +39 06 5010389 |
| E-mail: | italy@qd-europe.com |
