The best value research AFM
from NanosurfThe CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped to perform AFM at its best.
The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and airflow shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller and plug in power and USB.
- Research AFM with a competitive price tag
- Integrated system with small footprint
- 32 modes and functions
- Easy handling
Further information
Seamlessly extendable functionality
Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended. Advanced AFM modes and functionality like sample heating, environmental control, scripting, and many others can easily be added to your CoreAFM.
Powerful and versatile
State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended.
CoreAFM imaging modes
Standard imaging modes
- Static Force Mode
- Lateral Force Mode
- Dynamic Force Mode (Tapping Mode)
- Phase Imaging Mode
Magnetic properties
- Magnetic Force Microscopy
Electrical properties
- Conductive AFM (C-AFM)
- Piezoelectric Force Microscopy (PFM)
- Electrostatic Force Microscopy (EFM)
- Kelvin Probe Force Microscopy (KPFM)
Mechanical properties
- Force Spectroscopy
- Force Modulation
- Stiffness and Modulus
- Adhesion
- Unfolding and Stretching
- Force Mapping
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Applications
Downloads
Contact
Navigation
Categories
Contact
Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
Phone: | +39 06 5004204 |
Fax: | +39 06 5010389 |
E-mail: | italy@qd-europe.com |