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The best value research AFM

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The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped to perform AFM at its best.

The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and airflow shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller and plug in power and USB.

Features
  • Research AFM with a competitive price tag
  • Integrated system with small footprint
  • 32 modes and functions
  • Easy handling

Further information

Seamlessly extendable functionality

Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended. Advanced AFM modes and functionality like sample heating, environmental control, scripting, and many others can easily be added to your CoreAFM.

Powerful and versatile

State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended.

CoreAFM imaging modes

Standard imaging modes

  • Static Force Mode
  • Lateral Force Mode
  • Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode

Magnetic properties

  • Magnetic Force Microscopy

Electrical properties

  • Conductive AFM (C-AFM)
  • Piezoelectric Force Microscopy (PFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Force Microscopy (KPFM)

Mechanical properties

  • Force Spectroscopy
  • Force Modulation
  • Stiffness and Modulus
  • Adhesion
  • Unfolding and Stretching
  • Force Mapping

Lithography and Nanomanipulation

Electrochemical AFM (EC-AFM)

Applications

Topography of SrTiO3 in dynamic mode

Topography on multilayer graphene

KPFM on multilayer graphene

Magnetic force microscopy of thin permalloy film with stripe domains

Conductive AFM of an integrated circuit structure with multiple transistor contacts

Out of plane PFM on Lithium Niobate

Downloads

Evaluating AFM as an analysis tool for graphene

Contact

Dr. Stefano Pergolini
Dr. Stefano Pergolini

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com
Dr. Stefano PergoliniProduct Manager
+39 06 5004204
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