Sample Preparation

Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron ... more 

Ion milling system to prepare wide cross section of a sample, ion sputter to increase the conductivity of non-conductive sample and sample cleaner to reduce contamination which disturb electron microscope observation.

Ion Milling Systems
Ion milling systems implement an Ar+ ion beam to polish the surface of the sample and make it suitable for particular electron microscope analyzes. The systems support both cross-section milling and flat milling.

  • Cross-section Milling: Used to produce wider, undistorted cross sections without applying mechanical stress to the sample
  • Flat Milling: Used for removing surface layer artifacts and final polish after traditional mechanical polishing techniques.

Sample Cleaners
Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. For high quality electron analysis, it is necessary to remove this contamination from the surfaces with sample cleaners, which assure proper cleaning without damaging the samples.

Ion Sputter
An ion sputter increases the conductivity of non-conductive samples to prevent charging during electron microscope observation.

Sample Preparation - Ion Milling System ArBlade 5000
Ion Milling System ArBlade 5000

The ion milling system ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications ...


Sample Preparation - Ion Milling System IM4000Plus
Ion Milling System IM4000Plus

Ion milling systems (IMS) utilize a (low-energy) Ar-ion beam to produce wide and undistorted cross-sections or in order to polish typical SEM samples - without applying mechanical stress to the ...


Sample Preparation - ZONETEM Sample Cleaner
ZONETEM Sample Cleaner

The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples. ZONE is an easy-to-use cleaner for pre-analysis sample preparation, ensuring the ...


Sample Preparation - ZONESEMⅡ Sample Cleaner
ZONESEMⅡ Sample Cleaner

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.


Sample Preparation - MC1000 Ion Sputter
MC1000 Ion Sputter

MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depedng on the application.

Contact

Quantum Design s.r.l.

Via Francesco Sapori, 27
00143 Roma
Italy

Phone:+39 06 5004204
Fax:+39 06 5010389
E-mail:italy@qd-europe.com