Combined Raman and scanning nearfield optical microscopy (SNOM) system
alpha300 RS from WITecFor the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with scanning near-field optical microscopy (SNOM) for optical imaging with resolution beyond the diffraction limit. It combines all the features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for combined high-resolution Raman imaging techniques such as nearfield-Raman imaging.
- Provides all features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope in one instrument
- Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
- Ideally suited for combined techniques such as nearfield-Raman imaging
- Switch between the measurement techniques is realized by a rotation of the objective turret
- No sample movement between the measurements
Further information
The alpha 300RS offers the following extensions:
- alpha300 RS+ for automated measurements
- Automated motorized sample positioner in x-, y-, and z-direction, 25 mm travel range (50 mm travel range optional)
- Automated confocal Raman Imaging (25 x 25 mm; optional 50 x 50 mm)
- Automated multi-area and multi-point measurements
- 2D and 3D Raman mapping
- Raman depth profiling
- Autofocus
Specifications
Raman operation modes:
- Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
- Planar (x-y-direction) and depth scans (z-direction)
- Image stacks: 3D confocal Raman Imaging
- Time series
- Single point Raman spectrum acquisition
- Single-point depth profiling
- Ultrafast Raman Imaging (1300 spectra per second) optional available
- Confocal fluorescence microscopy
- Bright Field Microscopy
- Dark Field, Phase Contrast and DIC optional
- Upgradable for epi-fluorescence applications
- Dark Field, Phase Contrast and DIC optional
- SNOM Operation Modes
- Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
Confocal microscopy (CM) modes:
- Transmission
- Reflection
- Fluorescence (optional)
- SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
- Acquisition of force-distance curves and light-distance curves
- Fixed-bottom illumination
- Total internal reflection illumination (optional)
- AFM Operation Modes:
- AFM Modes
- Contact Mode
- Lateral Force Mode
Microscope features:
- Research grade optical microscope with 6 x objective turret
- Video system: eyepiece color video camera
- LED white-light source for Köhler illumination of tip and sample
- High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
- Manual sample positioning in x- and y-direction, 25 mm travel
- Microscope base with active vibration isolation system
- Piezo-driven scan stage (scan range 100 x 100 x 20 µm; others optional)
Sample size:
- Usually 120 mm in x- and y-direction, 25 mm in height (adapter for larger heights available)
Computer interface:
- WITec software for instrument and measurement control, data evaluation and processing
Applications
Downloads
Contact
