Our partner

Fast Mapping theta-SE

From Woollam Co.

The theta-SE is a push-button spectroscopic ellipsometer for characterizing thin film uniformity. It features advanced ellipsometry instrumentation in a compact package at an affordable price.

Features

Fully integrated
High Speed
Compact
User Friendly
Affordable

Further information

The theta-SE comes equipped with 300mm sample mapping, small-spot measurement beam, fast automated sample alignment, look-down camera and our latest Dual-Rotating ellipsometer technology. The theta-SE has everything you need to measure spatial uniformity of your film thickness and optical properties.

Specifications

Spectral range: 400 to 1000nm
Number of wavelengths (measured simultaneously): 190
Detector: CCD
Spot size: 250 x 600µm (on sample)
Data Acquisition Rate (per measurement spot, entire spectrum): 0.3 sec (fastest), 1-2 sec (typical)
Angel of incidence: 65°
Data Types: Spectroscopic ellipsometry and advanced g-SE or Mueller Matrix-SE