Invitation: Correlative In-Situ Analysis by combination of AFM, SEM, and FIB
- Whole wafer imaging
- Quantitative height measurements
- Combined SEM /AFM imaging
- Elasticity coefficient measuring and mapping
- Sub-nanometer resolution on non-conducting samples
More information on https://icn2.cat/en/
Contact
Dr.
Andreas
Bergner
Product Manager - Electron microscopy & nanotechnology
+49 6157 80710-12 | |
+49 6157 80710912 | |
Write e-mail |

Dr.
Andreas
Bergner