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Electron Diffractometer for Nanocrystals – ELDICO ED-1

from Eldico Scientific

The ELDICO ED-1 is the world’s first dedicated electron diffractometer, specifically designed for the structural analysis of nanocrystals. Combining a horizontal electron optics design with highly precise goniometry and state-of-the-art detector technology, it enables the investigation of crystals too small for conventional X-ray diffraction and delivers high-resolution diffraction data for advanced research and industrial applications.

Features

Horizontal beam path for optimal data quality and minimized systematic deviations
Electron energy: 160 keV – ideal for high-resolution 3D electron diffraction (3D-ED)
High-precision 5-axis goniometer with 140° rotation range
Hybrid pixel detector (DECTRIS QUADRO) for fast and sensitive data acquisition
Cryo-measurement support – ideal for sensitive or radiation-sensitive samples
Automated calibration and user-friendly operation
Low-dose electron beam for delicate materials
Compact, horizontal design for seamless integration into laboratory environments

Further information

The ELDICO ED-1 represents a paradigm shift in electron diffraction. While conventional TEM-based approaches were not originally designed for diffraction experiments, the ED-1 was built from the ground up for that specific purpose.

The horizontal beam path provides a highly stable and reproducible measurement environment, minimizing deviations in diffraction data and enabling highly accurate structure solutions. The combination of a dedicated diffractometer design, precise sample positioning, and a high-performance hybrid pixel detector allows resolutions down to 0.84 Å – even for nanocrystals as small as 10 – 1000 nm.

This opens up new possibilities for structural analysis in cases where traditional methods such as X-ray crystallography or powder diffraction reach their limitations.

Models

ELDICO ED-1

Currently, the ELDICO ED-1 is available as a standalone system.
Optional upgrades and extensions include:

Cryogenic cooling modules for sensitive samples
Advanced software modules for data analysis
In-situ stages and custom sample holders

Specifications

ELDICO ED-1 – Specifications
Parameter	Value
Electron energy	160 keV
Sample range	10 – 1000 nm
Resolution	up to 0.84 Å
Goniometer	5-axis system
Rotation range	140°
Detector	DECTRIS QUADRO hybrid pixel detector
Beam dose	Low-dose mode available
Calibration	Fully automated
Cryo support	Optional
Design	Horizontal
Software	Intuitive interface with automated data processing

Applications

The ELDICO ED-1 is designed for a wide range of advanced research and industrial applications, especially where sample size or sensitivity makes conventional X-ray methods unsuitable:

Pharmaceutical research: Polymorph analysis and structural determination of new APIs
Materials science: Analysis of complex oxides, semiconductors, and energy storage materials
Chemical industry: Catalyst development and structural identification of intermediates
Biogenic materials: Investigation of natural nanocrystals (e.g., guanine in biological structures)
Academic research: Fundamental studies in crystallography and materials design

Experimental results demonstrate that unit cell parameters can be determined with deviations of less than 0.36 % compared to literature values — highlighting the system’s exceptional precision.