High-Flux Side Window X-ray Sources for Imaging and XRD
from MoxtekMoxtek Side Window X-ray Sources are engineered for imaging and diffraction applications that require maximum photon flux, high spatial resolution, and flexible geometric integration. Their side-exit beam design enables exceptionally short spot-to-object distances, up to 30% higher X-ray flux compared to end-window sources, and large cone angles for wide-area illumination. These sources are ideal for XRD, radiographic imaging, non-destructive testing, and compact analytical instruments.
- Approximately 30% higher X-ray flux compared to end-window sources
- Small focal spot for high spatial resolution
- Very short spot-to-object distance (minimum ~7 mm)
- Large cone angle for larger detector coverage
- Close coupling of detector and source
- Portable, versatile, and easy to integrate
- Long operating life and fast sampling times
- Flexible form factor with configurable wiring lengths
Further information
Side window X-ray tubes provide clear advantages wherever imaging resolution and geometric magnification are critical. Because the X-rays exit from the side of the tube rather than from the end, the source can be positioned much closer to the sample — often as little as 7 mm. This enables higher magnification, reduced blur, and improved detection of fine structural details.
A key benefit of the Moxtek side-window architecture is its ~30% higher photon flux compared to end-window designs. This higher count rate is especially valuable in low-signal applications such as X-ray diffraction (XRD) or high-speed imaging. The compact geometry and large cone angle provide an expanded field of view at the detector, enabling faster measurements and improved coverage.
The flexible, configurable design allows users to choose different target materials (Cr, Cu, Mo, W) and wiring lengths (4–11.5 inches) to optimize the tube for specific systems. These sources can be integrated into benchtop, portable, or embedded instruments requiring stable X-ray output and reliable long-term operation.
Available Configurations
Multiple target materials:
- Cr
- Cu
- Mo
- W
Wiring lengths:
- 4 in to 11.5 in (101–292 mm)
Application-specific form factors available on request
Because the exact specifications depend on customer configuration, models are custom-engineered for each application.
Applications
Imaging
- Radiographic imaging
- Industrial NDT
- Portable imaging systems
- High-resolution magnification setups
X-ray Diffraction (XRD)
- Low-count-rate photon applications
- Powder diffraction
- Crystallography systems
Analytical Instruments
- Benchtop analyzers
- Custom imaging or diffraction equipment
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Contact
| +49 6157 80710-15 | |
| +49 6157 80710915 | |
| Write e-mail |
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Quantum Design GmbH
Breitwieserweg 9
64319 Pfungstadt
Germany
| Phone: | +49 6157 80710-0 |
| E-mail: | germanyqd-europe.com |
