Cryo preparation system for scanning electron microscopy
- Magnetism
- Materials science
- Spectroscopy
- Imaging
- Electron microscopy
- AFSEM - correlative AFM and SEM
- Accessories for SEM applications
- Cryo preparation system for scanning electron microscopy
- Detectors for SEM applications
- In situ TEM solutions
- In situ stages for electron microscopy and µXCT
- Sample preparation for electron microscopy
- Sputter & carbon coaters
- Tabletop- and Compact-Scanning Electron Microscopes
- Cryogenics
- Optics
- Light & lasers
- Life sciences
Cryo preparation system for scanning electron microscopy
The cryo preparation system allows the analysis of wet samples with scanning electron microscopy (SEM) at temperatures down to -190 °C. During cryo preparation, samples are frozen rapidly and fed ...