AccuFiz UV/IR Wavelength Fizeau Interferometers
from 4D TechnologyThe full AccuFiz product line offers wavelengths from 355 nm through 10.6 μm.
The standard wavelength is 632.8nm HeNe laser, wavelengths in the UV and IR ranges are optional.
Wavelengths from 355 nm to 10.6 µm enable measurement of optical components and systems at their functional wavelength.
- Fizeau Interferometer System
- Acquisition Mode: Temporal Phase Shifting; optional Dynamic Measurement
- 4Sight™ Data Analysis and Visualization Software
- Mounting Configurations Horizontal or vertical (look-down)
- Reference Optics Bayonet mounted
- Motorized controls: Zoom, focus, beam attenuation
- Visible Alignment Beam
Further information
AccuFiz UV and IR interferometers provide accurate measurement of polished or rough-ground optics and metal surfaces. AccuFiz infrared laser interferometers are ideal for measuring concave, convex and afocal IR components, as well as infrared telescopes and lens systems. Their ability to capture high slopes makes it possible to measure aspherical optics without the need for a holographic element.
On the shop floor or in a clean room, optional Dynamic Interferometry® enables very short exposure times, so you can measure despite vibration, without isolation.
Only AccuFiz includes Smart Zoom™ to ensure accurate lateral resolution over the entire 1X–10X zoom range. Diffraction-limited imaging provides unparalleled resolution, particularly at mid-spatial frequencies, to measure polishing artifacts that other interferometers miss.
How to measure optical components
4D Technology has been helping optics professionals to accurately measure optics for over 20 years: check the optical testing setups guide where they bring together all of that expertise, to help you make the best measurements in any environment!
Specifications
- Aperture: UV/NIR 100 mm (4 in), 150 mm (6 in); SWIR 100 mm (4 in); LWIR 75 mm
- 100 mm to 33 mm or to 150 mm Aperture Converters; range of beam expanders on request
- Laser Sources: 355 nm, 532 nm, 1053 nm, 1064 nm, 1550 nm and 10.6 μm wavelengths
- Handheld Controller Remote control of focus and zoom, pan, source diameter, measurement
- Zoom: Continuous 1–10x Smart Zoom with pan, calibrated at all zoom settings
- Dual Spot Camera Based Alignment Aid
- High Slope Capture for Aspheric Measurement
Applications
- Optical Metrology for Precision Machining, Photovoltaic, Semiconductor, Optics, Automotive and Defense & Aerospace Industry
- Wavefront transmission quality measurements at the functional wavelength
- Optical systems alignment
- Rough-Ground Optics and Metal Surfaces
Downloads
Contact
Navigation
Categories
Contact
Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
| Phone: | +39 06 5004204 |
| Fax: | +39 06 5010389 |
| E-mail: | italy@qd-europe.com |
