AttoMap™ - µXRF analytical microscope
from SIGRAYThe AttoMap™ x-ray analytical microscope offers the highest resolution and the highest sensitivity one can find in a laboratory based microXRF system. The AttoMap™ system can be used for transmission-based x-ray structural analysis as well as for fluorescence chemical mapping. The system has a chemical sensitivity of <1-10 ppm for trace element analysis and the measuring time is within 1 second.
Latest updates
High-resolution mapping for low atomic number elements with AttoMapTM
Sigray’s AttoMapTM system for X-ray micro-fluorescence (micro-XRF) has a patented design for precision compositional analysis: this allows the analysis of almost all elements of the periodic table. ...
Further information
The key advantages of the AttoMap™ system compared to standard µXRF systems are three major innovations developed by Sigray.
- The patented FAAST™ x-ray source with 50X higher brightness than microfocus sources used in standard microXRFs
- Proprietary, high efficiency x-ray mirror lens that provides a combination of small achromatic focus and large working distance for superior detection sensitivity and accuracy
- Unique detector geometry enabled by the design of the x-ray mirror lens that collects 10X more fluorescence x-rays than conventional designs.
These innovations provide the AttoMap™ with the ultimate laboratory microXRF performance:
- Substantially higher resolution at single digit microns-scale (e.g. 3-5 µm MTF) resolution versus conventional microXRF
- Detectability of nanoparticles down to 50-100 nm
- Dramatically faster analytical speed of a single minute - rather than a half day - for equivalent measurements on an AttoMap™ versus a conventional microXRF with up to 500X higher throughput
- Sub-ppm and sub-femtogram sensitivity in seconds
- >100X the sensitivity of standard microXRF
- Only microXRF that can map trace elements (conventional microXRF is capable of mapping only major constituents at reasonable throughputs, as it requires long spot acquisition times for trace elements)
- Most accurate quantification capabilities and optional dual energy source for maximum flexibility
- Ability to analyze buried microfeatures
Models
AttoMap-200
Parameter | Specification |
---|---|
Spot Size | High Res (<8 µm) | Med Res additional optics also available |
Sensitivity | Sub-ppm relative detection sensitivity and capable of mapping trace elements. Picogram to femtogram absolute sensitvity (element & acquisition time dependent) |
Additional Capabilities & Modules | 2D correlative x-ray imaging at <1 µm resolution included (standard) Optical microscopy included (standard) Future modules will be available as upgrades |
Footprint | 54” W x 65.5” H x 38.5” D |
Maximum Sample Size | 50 cm x 50 cm | 15 cm thickness |
Source | Sigray FAAST™ Microstructured Source |
Target Material | Dual Energy Option, includes selection from: Ti, Cu, Rh, W, Pt, Zr, etc. Custom target options include materials that have previously not been used in conventional sources. |
Power | Voltage | Current | 50 W | 20-50 kV | 4 mA |
X-ray Optic | Sigray Twin Paraboloidal X-ray Mirror Lens |
Transmission Efficiency | ~80% |
Working Distance | 10 - 50 mm (customizable) |
Interior Coating | Platinum (increases NA of optic significantly) |
X-ray Detectors | Two SDD detectors and an X-ray Camera |
Energy Resolution | <135 eV at Mn-Ka |
AttoMap-300
Parameter | Specification |
---|---|
Spot Size | High Res (<8 µm) |
Sensitivity | Sub-ppm relative detection sensitivity and capable of mapping trace elements. Picogram to femtogram absolute sensitvity (element & acquisition time dependent) |
Additional Capabilities & Modules | Optical microscopy and x-ray transmission microscopy included |
Footprint | 54” W x 65.5” H x 38.5” D |
Stage Travel | 100 x 100 mm (upgrades available upon request) |
Maximum Sample Size | 100 x 100 mm standard operation, ~30 x 30 mm at grazing angles | 20 mm thickness |
Source | Sigray Patented High Brightness Microfocus Source |
Target Material | Multiple x-ray targets (up to 4) includes selection from: SiC, Cr, Cu, Rh, W, Mo, Au, etc. |
Power | Voltage | Current | 50 W | 20-50 kV | 2 mA |
X-ray Optic | Sigray Twin Paraboloidal X-ray Optics (matched to each target material) |
Transmission Efficiency | ~80% |
Magnification | 1:1 Magnification Default; Demagnifying optics for higher resolution available upon request |
Interior Coating | Platinum ((increases collection efficiency of optic significantly)) |
Energy Resolution | <129 eV at Mn-Ka | <=136 eV at 5.9 keV |
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Contact
Dr.
Simone
Paziani
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Quantum Design s.r.l.
Via Francesco Sapori, 27
00143 Roma
Italy
Phone: | +39 06 5004204 |
Fax: | +39 06 5010389 |
E-mail: | italy@qd-europe.com |