Our partner

CCD and sCMOS cameras for direct detection

Marana-X, iKon SO and Newton SO from Oxford Instruments Andor

Besides their standard use as imaging devices CCD and sCMOS sensors are also suitable for the direct detection of VUV, EUV light and soft X-rays. For this purpose, we offer back illuminated CCD and sCMOS sensors without anti-reflection coatings and micro-lens arrays. Deep thermoelectric cooling as well as good linearity and homogeneity allow to detect even the weakest signals over long exposure times.

Features

Back illuminated CCD and sCMOS sensors without anti-reflection coatings
Pixel sizes 6.5 µm, 13 µm, 13.5 µm, 15 µm, and 26 µm
Thermo-electrical cooling to -100 °C for negligible dark current
High quality 16 and 18 bit AD converters for low readout noise
Flanges compatible with any vacuum port

Further information

We offer vacuum compatible CCD detectors with various sensor formats. Detection of VUV, EUV light and soft X-rays occurs by direct absorption of photons in the depletion layer of a pixel. Depending on the energy of the photon a number of electron-hole pairs is created. Excellent linearity and homogeneity ensures the quality of measurement data. CF or other type of vacuum flanges can be offered upon request. Andor X-ray cameras are used in many research labs for high energy physics around the world.

Specifications

Marana-X

iKon-XL SO 231 (4096 x 4108 x 15 µm)

pdf

iKon-M-L_SO.pdf

2.85 MB

iKon-L SO 936 (2048 x 2048 x 13,5 µm)

pdf

Newton_SO.pdf

2.49 MB

Newton SO 940 (2048 x 512 x 13,5 µm)

Applications

Higher harmonic generation

Soft X-rays

VUV and EUV spectroscopy

Synchrotron radiation

X-ray tomography

Downloads

Detection of high energy radiation

Vacuum flanges

Liquid cooling system EXT-440

Software for cameras and spectropgraphs

X-ray damage

Remote camera server

Videos

Webinar Scientific Cameras Part 1

Webinar Scientific Cameras Part 2

The Future of Fast, High DNR Soft X Ray & EUV Detection

Remote Camera Server Online Seminar

Reference customers

Title	Author(s)	Institute	Year	Detector
Spectroscopy
Ultra-broadband spectrometry in the extreme ultraviolet (EUV)	L. Bahrenberg, S. Schröder, S. Brose	Chair for Technology of Optical Systems (TOS), RWTH Aachen University, Germany	2020	Newton SO DO940P-BN
A new compact soft X-ray spectrometer for RIXS studies at PETRA III	Z. Yin^1,2, S. Techert^1,2,3	¹FS-SCS, Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany ² Structural Dynamics of (Bio)chemical Systems, Max Planck Institute for Biophysical Chemistry, Göttingen, Germany ³Institute of X-ray Physics, Georg-August University, Göttingen, Germany	2017	iKon-L SO DO936N-OZ-BN
High-harmonic radiation for seeding the swiss free electron lase	J. Rauschenberger¹, C. Hauri²	¹H+P SPECTROSCOPY, Dr. Hoerlein + Partner GbR, Mannheim, Germany, ²Paul Scherrer Institut, Villigen, Switzerland	2016	Newton SO DO940P-BN
Investigation of spin dynamics in Ni-Pd alloys using extreme ultraviolet radiation	S. Gang, R. Adam, M. Plötzing, C. M. Schneider	Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich GmbH, JARA, Jülich, Germany	2016	Newton SO DO920P-BEN
Compact soft x-ray spectrometer for laser-matter studies	R. Irsig	Institute of Physics, University of Rostock, Germany	2012	Newton SO DO940P-BN
Warm dense matter analysis	P. Neumayer, D. Hochhaus et al.	GSI, Darmstadt, Germany	2012	iKon-M SO DO934P-BN DX420-BN
Element-selective ultrafast magnetization dynamics	D. Rudolf¹, Chan La-O-Vorakiat², E. Turgut², P. Grychtol^1,4, R. Adam¹, S. Mathias⁴, J. M. Shaw³, H. T. Nembach³, T. J. Silva ³, M. Aeschlimann⁴, C. M. Schneider¹, M. M. Murnane², H. C. Kapteyn²	¹Peter Grünberg Institute (PGI-6), Forschungszentrum Jülich, Germany ²Department of Physics and JILA, University of Colorado, Boulder, USA ³Electromagnetics Division, National Institute of Standards and Technology, Boulder, USA ⁴University of Kaiserslautern and Research Center OPTIMAS, Kaiserslautern, Germany	2012	iKon-L SO DO936N-MW-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases	T. Popmintchev¹, M.-C. Chen¹, D. Popmintchev¹, S. Ališauskas², G. Andriukaitis², T. Balčiūnas², A. Pugžlys², A. Baltuška², M. Murnane¹, H. Kapteyn¹	¹ JILA, University of Colorado, Boulder, USA ² Photonics Institute, Vienna University of Technology, Austria	2011	Newton SO DO920N-BN
Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates	M. Ibek, T. Leitner, P. Wernet, A. Firsov, A. Erko	Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany	2011	iKon-L SO DO936N-MW-BN
Sample analysis with a grazing incidence XUV reflectometer	S. Brose, M. Banyay, L. Juschkin, S. Danylyuk	Chair for the Technology of Optical Systems, RWTH Aachen, Germany	2011	DX440-BN²
Single event spectroscopy on laser generated x-ray beams	C. Kern, M. Schnell, C. Spielmann	Institute of Optics and Quantum Electronics, University of Jena, Germany	2010	iKon-L SO DO936N-MW-BN
Spectral and spatial characterization of harmonics in the XUV region	S. Eyring, C. Kern, J. Lohbreier, R. Spitzenpfeil, C. Spielmann	Institute of Optics and Quantum Electronics, University of Jena, Germany	2009	DO420-BN¹
A calibrated compact soft X-Ray spectrometer	H. Stiel, H. Legall	Max Born Institute of Nonlinear Optics and Ultrafast Spectroscopy, Berlin, Germany	2009	iDus SO DO420A-BN³
Time resolved X-Ray diffraction	I. Uschmann	Institute of Optics and Quantumelectronics, University of Jena, Germany	2007	DX420-BR-DD²
Laserartige XUV-Strahlung: Charakterisierung und Handhabung von Gasharmonischen	A. Klein, D. Hemmers, G. Pretzler	Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany	2006	DO420-BN¹
Characterization of light sources
High-harmonic radiation for seeding the swiss free electron lase	J. Rauschenberger¹, C. Hauri²	¹H+P SPECTROSCOPY, Dr. Hoerlein + Partner GbR, Mannheim, Germany, ²Paul Scherrer Institut, Villigen, Switzerland	2016	Newton DO940P-BN
Spatial characterization of a discharge based radiation	K. Bergmann, J. Vieker	Fraunhofer Institute for Laser Technology, Aachen, Germany	2013	iKon-M SO DO934P-BN
Table-top coherent x-ray-source from mid-infrared high power laser interaction with gases	T. Popmintchev¹, M.-C. Chen¹, D. Popmintchev¹, S. Ališauskas², G. Andriukaitis², T. Balčiūnas², A. Pugžlys², A. Baltuška², M. Murnane¹, H. Kapteyn¹	¹ JILA, University of Colorado, Boulder, USA ² Photonics Institute, Vienna University of Technology, Austria	2011	Newton SO DO920N-BN
Monochromatizing a femtosecond high-order harmonic VUV photon source with reflective off-axis zone plates	M. Ibek, T. Leitner, P. Wernet, A. Firsov, A. Erko	Methods and Instrumentation for Synchrotron Radiation Research and Nanometer Optics and Technology, Helmholtz Center Berlin for Materials and Energy, Germany	2011	iKon-L SO DO936N-MW-BN
Single event spectroscopy on laser generated x-ray beams	C. Kern, M. Schnell, C. Spielmann	Institute of Optics and Quantum Electronics, University of Jena, Germany	2010	iKon-L SO DO936N-MW-BN
Spectral and spatial characterization of harmonics in the XUV region	S. Eyring, C. Kern, J. Lohbreier, R. Spitzenpfeil, C. Spielmann	Institute of Optics and Quantum Electronics, University of Jena, Germany	2009	DO420-BN¹
Time resolved X-Ray diffraction	I. Uschmann	Institute of Optics and Quantumelectronics, University of Jena, Germany	2007	DX420-BR-DD²
Laserartige XUV-Strahlung: Charakterisierung und Handhabung von Gasharmonischen	A. Klein, D. Hemmers, G. Pretzler	Institute of Laser- and Plasmaphysics, University of Düsseldorf, Germany	2006	DO420-BN¹
Small angle scattering using XUV light from high-order harmonic generation	Ch. Weier, R. Adam, C. M. Schneider	Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany	2014	Newton SO DO920P-BN
Microscopy
Soft x-ray microscopy using a table-top laser-induced plasma source based on a pulsed gas jet	M. Müller, K. Mann	Laser-Laboratorium Göttingen e.V., Optics / Short Wavelengths	2017	iKon-L SO DO936N-OW-BN
Coherent microscopy with soft X-rays	R. Heine, A. Rosenhahn	Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe, and Institute of Applied Physical Chemistry, University of Heidelberg, Germany	2010	DODX436-BN²
Scattering
Small angle scattering using XUV light from high-order harmonic generation	Ch. Weier, R. Adam, C. M. Schneider	Peter Grünberg Institute, Forschungszentrum Jülich GmbH, Germany	2014	Newton SO DO920P-BN
Coherent X-ray scattering experiments at the coherence beamline P10 at PETRA III	L. Müller, F. Westermeier, M. Sprung	Coherent X-Ray Scattering, DESY, Hamburg, Germany	2013	iKon-L SO DO936N-MW-BR-DD
Time-resolved resonant soft x-ray scattering with free-electron lasers	W. Schlotter¹, F. Sorgenfrei², M. Beye³, W. Wurth²	¹Stanford Linear Accelerator Center, Menlo Park, USA ²Institute for Experimental Physics and Center for Free-Electron Laser Science, University of Hamburg, Germany 3 Helmholtz Centre for Materials and Energy, Berlin, Germany	2011	iKon-L SO DO936N-MW-BN
Coherent diffraction imaging
Tabletop coherent diffractive imaging with a gas-discharge extreme ultraviolet light source	L. Juschkin^1,2, J. Bußmann^1,2, L. Loetgering¹, D. Rudolf^1,2, S. Brose³, S. Danylyuk³, R. Xu⁴, J. Miao⁴	¹Experimental Physics of EUV, RWTH Aachen University, JARA-FIT, Aachen, Germany ²Peter Grünberg Institut (PGI-9), Forschungszentrum Jülich GmbH, JARA-FIT, Jülich, Germany ³Chair for Technology of Optical Systems, RWTH Aachen University, JARA-FIT, Aachen, Germany ⁴Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, USA	2014	iKon-M SO DO934P-BN
Lensless coherence diffraction imaging with an ultra- narrowband laser-based extreme-ultraviolet source	S. Witte, V. T. Tenner, D. W. E. Noom, K. S. E. Eikema	Institute for Lasers, Life and Biophotonics (LaserLaB), VU University Amsterdam, The Netherlands	2014	iKon-M SO DO934P-BN
Phase-contrast imaging
Quantitative X-Ray phase imaging of impact damaged carbon-fiber-reinforced polymers	M. Hildebrand, M. Leck, M. Korth	Department of Analytical Measurement Technology, University of Applied Sciences and Arts, Göttingen, Germany	2013	iKon-M SO DO934P-BR-DD
Interferometry
XUV Interferometry using thin-film beam splitters	U. Zastrau¹, V. Hilbert¹, M. Wünsche^1, S. Zhang¹, C. Rödel^1,2, E. Förster ²	¹Institute of Optics and Quantum Electronics, University of Jena, Germany ²Helmholtz Institute Jena, Germany	2012	iKon-L SO DO936N-MZ-BN
Interferometry in the XUV spectral range using laser- generated high-order harmonics	D. Hemmers, G. Pretzler	Institute of Functional Interfaces, Karlsruhe Institute of Technology, Karlsruhe, and Institute of Applied Physical Chemistry, University of Heidelberg, Germany	2006	DO420-BN¹

Remarks:
¹DO420 replaced by Newton SO 920
²not available any more
³iDus SO replaced by Newton SO

Contact

Ing. Alessandro Baratti

Product Manager

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