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Nanoscale surface characterization system

Alpha300 A from WITec

The WITec atomic force microscope (AFM) alpha300 A is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope which provides superior optical access, easy cantilever alignment and high-resolution sample survey.

Features

Surface characterization on the nanometer scale
Nondestructive analysis
Minimal, if any, sample preparation
Ease of use in air and liquids
Precise TrueScan controlled scan stage with a range of 100 µm x 100 µm x 20 µm

Further information

WITec atomic force microscopes (AFMs) are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.

The alpha300A offers the following extensions:

Automated multi-area measurements (incl. auto approach)
Automated motorized sample positioner in x-, y-, and z-direction, 25 mm travel range
alpha300 A+ for automated measurements
alpha500 A for automated large sample investigations
Motorized scan stage for large-area measurements (150 x 100 mm) with automated sample positioner in x-, y-, and z-direction
Motorized z-stage system for automated approach
Automated multi-area and multi-point measurements
Autofocus

Specifications

Operation Modes:

Contact Mode
AC Mode (Tapping Mode)
Digital Pulsed Force Mode (DPFM)
Lift Mode
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM)
Phase Imaging
Force Distance Curves
Nano-Manipulation/Lithography
Lateral Force Microscopy (LFM)
Chemical Force Microscopy (CFM)
Current Sensing Mode
Microscope Features:
Research grade optical microscope with 6 x objective turret
Video system: eyepiece color video camera
LED white-light source for Köhler illumination of tip and sample
High sensitivity b/w video camera to view sample and AFM tip in transmission
Manual sample positioning in x- and y-direction, 25 mm travel
Microscope base with active vibration isolation system
Piezo-driven scan stage (scan range 100 x 100 x 20 µm; others optional)

AFM Cantilever:

Inertial drive cantilever mechanics for AFM sensors
Most commercially available AFM cantilever can be used

Sensors:

AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
Most commercially available sensors can be used

Sample Size:

Usually 120 mm in x- and y-direction, 25 mm in height (adapter for larger heights available)

Computer Interface:

WITec software for instrument and measurement control, data evaluation and processing

Applications

Life science From measurements in liquids to solid samples or soft tissues in life science varied samples are analyzed on a regular basis. With their convenient handling and versatile analytical capabilities the flexible WITec imaging systems provide the opportunity to adjust the imaging technique to changing requirements and are particularly well-suited for life science.

Pharmaceutics, cosmetics The development and production of drug delivery systems requires efficient and reliable control mechanisms to ensure the quality of the final products. These products can vary widely in composition and application. Therefore analytical tools such as the WITec imaging systems that provide both comprehensive chemical characterization and the flexibility to adjust the method to the investigated specimen are preferred in pharmaceutical research.

Materials science Materials science is a diverse field including the development and testing of new substances, as well as the refinement of manufacturing processes and quality control for existing products. WITec imaging systems are particularly well-suited for comprehensive sample analyses in materials science and provide the opportunity to acquire a thorough knowledge of the sample surface morphology and chemical composition.

Geoscience WITec confocal Raman imaging systems are excellent analytical tools for the comprehensive investigation of geological samples, such as the identification and characterization of minerals, or in the observation of mineral phase transitions in high and ultra-high pressure/temperature experiments.

Polymers WITec imaging systems enable comprehensive sample analysis that provides a thorough characterization of the physical and chemical properties of the polymers on the nanometer scale.

Nano-Carbon and graphene Nano-carbon materials such as graphene or carbon nano-tubes show immense promise in many applications such as transistors, sensors, and optoelectronics. Flexible and adaptive analytical methods can support effective investigation and accelerate progress in nano-carbon & graphene research and development.