Portable Optical Profilers
- Materials science
- 3D Confocal Raman microscopes
- Atomic force microscopes (AFM)
- Correlative Microscopy – Raman/AFM/SNOM/SEM
- FP profiler for large format samples
- Flexus thin film stress measurement systems
- Furnace for crystal fabrication
- Hall effect
- Laser Interferometers
- Micro-computed tomography scanners for materials science
- Motion control systems
- Nanoindenters - Nanohardness tester
- Particle size analyzer
- Photo lithography systems
- Portable Optical Profilers
- Spectroscopic ellipsometers
- Spin coater
- Systems to measure physical properties
- Thermoelectric measurements
- Very-low resistance measurements
- Electron microscopy
- Light & lasers
- Life sciences
- Products for industry
Optical profilers from 4D measure surface roughness and defects on smooth and supersmooth surfaces. Using Dynamic interferometry techniques exclusive to 4D, these profilometer measurements are ... more
Optical profilers from 4D measure surface roughness and defects on smooth and supersmooth surfaces. Using Dynamic interferometry techniques exclusive to 4D, these profilometer measurements are non-contact and immune to vibration. The instruments are extremely portable and are able to perform surface profiling in the most challenging environments, at production speeds.
NanoCam Sq Optical Profiler
The NanoCam Sq non-contact optical profiler measures surface roughness on supersmooth optics and precision surfaces. The NanoCam Sq is a movable optical detection unit that can be positioned by hand or robotically. The compact and lightweight measurement head is highly flexible and can measure roughness anywhere on large optics, mirror segments or small optics.
The NanoCam Sq optical profilometer utilizes Dynamic Interferometry® and, because the acquisition time is so short, the NanoCam Sq can measure despite vibration.
InSpec Surface Gauge
The 4D InSpec Surface Gauge is the first handheld, precision instrument for non-contact surface defect measurement. With micrometer-level resolution, portability, affordability and ease-of-use, 4D InSpec instantly quantifies defects such as pits, scratches, nicks, dents and bumps, and measures features such as edge break, radii, rivet depth and dot peen depth, from 5 µm o 9 mm deep/tall. 4D InSpec is far more repeatable and accurate than visual comparison techniques typically used for surface defect measurements. And unlike high-end metrology systems it is rugged, flexible and affordable, to measure a wide range of part geometries in the most challenging environments.